Inventor · disambiguated record
Chul-Woong Jang
Also filed as: JANG CHUL WOONG
4 granted patents·3 pending applications·18 citations·filing 2006–2023
70Inventor score
Top patents by PatentIndex Score
7 records- 0178US7772828B2Automatic test equipment capable of high speed testSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Aug 10, 2010·11 cites·18 claims
- 0266US8476908B2Signal capture system and test apparatus including the sameCHOI WOON-SUP·Filed 2010·Granted Jul 2, 2013·3 cites·15 claims
- 0366US7816937B2Apparatus for testing a semiconductor packageSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Oct 19, 2010·3 cites·16 claims
- 0460US8103927B2Field mounting-type test apparatus and method for testing memory component or module in actual PC environmentCHOI IN-HO·Filed 2009·Granted Jan 24, 2012·1 cites·19 claims
- 0553US2024327261A1Water treatment systemHIFILM INC·Filed 2023·Application pending·0 cites
- 0639US2007101219A1Semiconductor testing apparatus and method of calibrating the sameJANG SEUNG-HO·Filed 2006·Application pending·0 cites
- 0738US2007085551A1Calibration jig and calibration apparatus having the sameJANG SEUNG-HO·Filed 2006·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →