Inventor · disambiguated record
Joseph Benjamin Ross
Also filed as: ROSS JOSEPH B · ROSS JOSEPH BENJAMIN
16 granted patents·1 pending application·174 citations·filing 2000–2015
93Inventor score
Files withGEN ELECTRIC17
Top patents by PatentIndex Score
17 records- 0185US6678057B2Method and device for reduction in noise in images from shiny partsGEN ELECTRIC·Filed 2001·Granted Jan 13, 2004·26 cites·10 claims
- 0284US7898651B2Methods and apparatus for inspecting an objectGEN ELECTRIC·Filed 2005·Granted Mar 1, 2011·19 cites·13 claims
- 0382US7327857B2Non-contact measurement method and apparatusGEN ELECTRIC·Filed 2004·Granted Feb 5, 2008·28 cites·13 claims
- 0479US6985238B2Non-contact measurement system for large airfoilsGEN ELECTRIC·Filed 2002·Granted Jan 10, 2006·26 cites·21 claims
- 0577US7499830B2Computer-implemented techniques and system for characterizing geometric parameters of an edge break in a machined partGEN ELECTRIC·Filed 2005·Granted Mar 3, 2009·9 cites·19 claims
- 0670US7187436B2Multi-resolution inspection system and method of operating sameGEN ELECTRIC·Filed 2004·Granted Mar 6, 2007·8 cites·29 claims
- 0768US6700668B2Method of measuring a part with a wide range of surface reflectivitiesGEN ELECTRIC·Filed 2002·Granted Mar 2, 2004·15 cites·14 claims
- 0866US7925075B2Inspection system and methods with autocompensation for edge break gauging orientationGEN ELECTRIC·Filed 2007·Granted Apr 12, 2011·5 cites·15 claims
- 0962US7302109B2Method and system for image processing for structured light profiling of a partGEN ELECTRIC·Filed 2003·Granted Nov 27, 2007·9 cites·27 claims
- 1062US7301165B2Methods and apparatus for inspecting an objectGEN ELECTRIC·Filed 2005·Granted Nov 27, 2007·4 cites·20 claims
- 1162US7194474B2Method of processing test informationGEN ELECTRIC·Filed 2000·Granted Mar 20, 2007·9 cites·7 claims
- 1259US6906808B2Methods and apparatus for measuring a surface contour of an objectGEN ELECTRIC·Filed 2002·Granted Jun 14, 2005·9 cites·17 claims
- 1356US7365862B2Methods and apparatus for inspecting an objectGEN ELECTRIC·Filed 2005·Granted Apr 29, 2008·5 cites·20 claims
- 1446US8045181B2Inspection system and method with multi-image phase shift analysisGEN ELECTRIC·Filed 2009·Granted Oct 25, 2011·0 cites·20 claims
- 1543US9587933B2System and method for inspecting an objectGEN ELECTRIC·Filed 2015·Granted Mar 7, 2017·0 cites·20 claims
- 1643US7099017B2Methods and apparatus for measuring flow opening areasGEN ELECTRIC·Filed 2003·Granted Aug 29, 2006·2 cites·18 claims
- 1743US2007090310A1Methods and apparatus for inspecting an objectGEN ELECTRIC·Filed 2005·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →