Inventor · disambiguated record
Kueing-Long Chen
Also filed as: CHEN KUEING L · CHEN KUEING-LONG
12 granted patents·360 citations·filing 1986–1999
93Inventor score
Files withTEXAS INSTRUMENTS INC12
Top patents by PatentIndex Score
12 records- 0187US5077591AElectrostatic discharge protection for semiconductor input devicesTEXAS INSTRUMENTS INC·Filed 1988·Granted Dec 31, 1991·55 cites·12 claims
- 0275US5625220ASublithographic antifuseTEXAS INSTRUMENTS INC·Filed 1994·Granted Apr 29, 1997·51 cites·10 claims
- 0375US4825280AElectrostatic discharge protection for semiconductor devicesTEXAS INSTRUMENTS INC·Filed 1986·Granted Apr 25, 1989·31 cites·39 claims
- 0474US4784966ASelf-aligned NPN bipolar transistor built in a double polysilicon CMOS technologyTEXAS INSTRUMENTS INC·Filed 1987·Granted Nov 15, 1988·31 cites·17 claims
- 0568US5166557AGate array with built-in programming circuitryTEXAS INSTRUMENTS INC·Filed 1991·Granted Nov 24, 1992·20 cites·15 claims
- 0667US5284788AMethod and device for controlling current in a circuitTEXAS INSTRUMENTS INC·Filed 1992·Granted Feb 8, 1994·31 cites·20 claims
- 0766US5005066ASelf-aligned NPN bipolar transistor built in a double polysilicon CMOS technologyTEXAS INSTRUMENTS INC·Filed 1989·Granted Apr 2, 1991·24 cites·10 claims
- 0865US5395797AAntifuse structure and method of fabricationTEXAS INSTRUMENTS INC·Filed 1993·Granted Mar 7, 1995·34 cites·12 claims
- 0962US5219782ASublithographic antifuse method for manufacturingTEXAS INSTRUMENTS INC·Filed 1992·Granted Jun 15, 1993·30 cites·16 claims
- 1058US5365105ASidewall anti-fuse structure and method for makingTEXAS INSTRUMENTS INC·Filed 1993·Granted Nov 15, 1994·26 cites·24 claims
- 1151US5434432AAntifuse device for controlling current in a circuit using an antifuseTEXAS INSTRUMENTS INC·Filed 1993·Granted Jul 18, 1995·15 cites·7 claims
- 1245US6239003B1Method of simultaneous fabrication of isolation and gate regions in a semiconductor deviceTEXAS INSTRUMENTS INC·Filed 1999·Granted May 29, 2001·12 cites·14 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →