Inventor · disambiguated record
Stephen P. Renwick
Also filed as: RENWICK STEPHEN · RENWICK STEPHEN P · RENWICK STEPHEN PAUL
12 granted patents·2 pending applications·36 citations·filing 2002–2022
88Inventor score
Files withNIKON CORP6NIKON PREC INC2RENWICK STEPHEN P2BOLAND KIERAN G A1BOLAND KIERAN GERARD ANTHONY1
Top patents by PatentIndex Score
14 records- 0184US11061338B2High-resolution position encoder with image sensor and encoded target patternNIKON CORP·Filed 2018·Granted Jul 13, 2021·3 cites·44 claims
- 0278US8438507B2Systems and methods for adjusting a lithographic scannerRENWICK STEPHEN P·Filed 2009·Granted May 7, 2013·6 cites·32 claims
- 0377US10890849B2EUV lithography system for dense line patterningNIKON CORP·Filed 2017·Granted Jan 12, 2021·1 cites·18 claims
- 0476US11099483B2Euv lithography system for dense line patterningNIKON CORP·Filed 2017·Granted Aug 24, 2021·1 cites·29 claims
- 0574US10871708B2Spatial-frequency matched wafer alignment marks, wafer alignment and overlay measurement and processing using multiple different mark designs on a single layerNIKON CORP·Filed 2018·Granted Dec 22, 2020·2 cites·40 claims
- 0670US8953471B2Counteracting spam in voice over internet protocol telephony systemsBOLAND KIERAN GERARD ANTHONY·Filed 2012·Granted Feb 10, 2015·4 cites·5 claims
- 0769US8755331B2Determining a physical location of a wireless mobile deviceBOLAND KIERAN G A·Filed 2011·Granted Jun 17, 2014·4 cites·6 claims
- 0865US12346029B2Curved reticle by mechanical and phase bending along orthogonal axesNIKON CORP·Filed 2022·Granted Jul 1, 2025·0 cites·34 claims
- 0965US8448060B2Method, system and software tool for processing an electronic formDESMOND MICHAEL·Filed 2005·Granted May 21, 2013·6 cites·16 claims
- 1063US6943882B2Method to diagnose imperfections in illuminator of a lithographic toolNIKON PREC INC·Filed 2002·Granted Sep 13, 2005·8 cites·41 claims
- 1161US9077637B2Determining a physical location of a wireless mobile deviceIBM·Filed 2014·Granted Jul 7, 2015·1 cites·3 claims
- 1257US2022293390A1E-beam position trackerNIKON CORP·Filed 2022·Application pending·0 cites
- 1351US8300214B2System and method for an adjusting optical proximity effect for an exposure apparatusRENWICK STEPHEN P·Filed 2008·Granted Oct 30, 2012·0 cites·20 claims
- 1451US2013044308A1System and method for an adjusting optical proximity effect for an exposure apparatusNIKON PREC INC·Filed 2012·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →