Inventor · disambiguated record
Amit Weingarten
Also filed as: WEINGARTEN AMIT
9 granted patents·1 pending application·33 citations·filing 2001–2021
83Inventor score
Files withEL MUL TECH LTD4NOVA MEASURING INSTR LTD3NOVA MEASURING INSTR INC2EL MUT TECHNOLOGIES LTD1
Top patents by PatentIndex Score
10 records- 0189US11183377B2Mass spectrometer detector and system and method using the sameNOVA MEASURING INSTR INC·Filed 2017·Granted Nov 23, 2021·6 cites·19 claims
- 0286US10236155B2Detection assembly, system and methodEL MUL TECH LTD·Filed 2016·Granted Mar 19, 2019·5 cites·21 claims
- 0372US11823883B2Mass spectrometer detector and system and method using the sameNOVA MEASURING INSTR INC·Filed 2021·Granted Nov 21, 2023·0 cites·7 claims
- 0472US9076632B2Position sensitive STEM detectorEL MUT TECHNOLOGIES LTD·Filed 2013·Granted Jul 7, 2015·4 cites·20 claims
- 0566US6654108B2Test structure for metal CMP process controlNOVA MEASURING INSTR LTD·Filed 2001·Granted Nov 25, 2003·12 cites·23 claims
- 0665US6885446B2Method and system for monitoring a process of material removal from the surface of a patterned structureNOVA MEASURING INSTR LTD·Filed 2002·Granted Apr 26, 2005·6 cites·43 claims
- 0763US11536604B1Light sensor assembly in a vacuum environmentEL MUL TECH LTD·Filed 2020·Granted Dec 27, 2022·0 cites·20 claims
- 0852US11656371B1High dynamic range detector with controllable photon flux functionalityEL MUL TECH LTD·Filed 2021·Granted May 23, 2023·0 cites·21 claims
- 0945US10910193B2Particle detection assembly, system and methodEL MUL TECH LTD·Filed 2019·Granted Feb 2, 2021·0 cites·18 claims
- 1034US2001015811A1Test structure for metal CMP process controlNOVA MEASURING INSTR LTD·Filed 2001·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →