Inventor · disambiguated record
Heiko Ahrens
Also filed as: AHRENS HEIKO
7 granted patents·5 citations·filing 2012–2022
72Inventor score
Technology areasG01R
Top patents by PatentIndex Score
7 records- 0163US9091726B1Method and apparatus for performing self-testing within an IC deviceREGNER MARKUS·Filed 2014·Granted Jul 28, 2015·2 cites·10 claims
- 0261US9529047B2Integrated circuit device and method of performing self-testing within an integrated circuit deviceREGNER MARKUS·Filed 2014·Granted Dec 27, 2016·2 cites·16 claims
- 0354US12055587B2Integrated test circuit, test assembly and method for testing an integrated circuitINFINEON TECHNOLOGIES AG·Filed 2022·Granted Aug 6, 2024·0 cites·20 claims
- 0453US11874325B2Integrated circuit, test assembly and method for testing an integrated circuitINFINEON TECHNOLOGIES AG·Filed 2022·Granted Jan 16, 2024·0 cites·20 claims
- 0549US9435862B2Integrated circuit device and method thereforLITOVCHENKO VLADIMIR·Filed 2014·Granted Sep 6, 2016·1 cites·13 claims
- 0643US11619668B2Integrated circuit with self-test circuit, method for operating an integrated circuit with self-test circuit, multi-core processor device and method for operating a multi-core processor deviceINFINEON TECHNOLOGIES AG·Filed 2021·Granted Apr 4, 2023·0 cites·24 claims
- 0725US9448283B2Circuit arrangement for logic built-in self-test of a semiconductor device and a method of operating such circuit arrangementAHRENS HEIKO·Filed 2012·Granted Sep 20, 2016·0 cites·17 claims
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