Inventor · disambiguated record
Yasuhiro Mitsui
Also filed as: MITSUI YASUHIRO
62 granted patents·5 pending applications·1,636 citations·filing 1986–2023
99Inventor score
Files withHITACHI LTD28MITSUBISHI STEEL MFG13MITSUI YASUHIRO8HITACHI HIGH TECH CORP6OKI ELECTRIC IND CO LTD3
Top patents by PatentIndex Score
67 records- 0197US8615848B2Hinge apparatus for electronic deviceMITSUI YASUHIRO·Filed 2011·Granted Dec 31, 2013·55 cites·3 claims
- 0297US6781125B2Method and apparatus for processing a micro sampleHITACHI LTD·Filed 2001·Granted Aug 24, 2004·114 cites·14 claims
- 0396US7205560B2Method and apparatus for processing a micro sampleHITACHI LTD·Filed 2005·Granted Apr 17, 2007·32 cites·27 claims
- 0496US7205554B2Method and apparatus for processing a micro sampleHITACHI LTD·Filed 2005·Granted Apr 17, 2007·34 cites·5 claims
- 0596US5481109ASurface analysis method and apparatus for carrying out the sameHITACHI LTD·Filed 1993·Granted Jan 2, 1996·121 cites·80 claims
- 0695US7550750B2Method and apparatus for processing a micro sampleHITACHI LTD·Filed 2007·Granted Jun 23, 2009·26 cites·32 claims
- 0795US6927391B2Method and apparatus for processing a micro sampleHITACHI LTD·Filed 2004·Granted Aug 9, 2005·69 cites·4 claims
- 0894US7470918B2Method and apparatus for processing a micro sampleHITACHI LTD·Filed 2007·Granted Dec 30, 2008·22 cites·15 claims
- 0994US7465945B2Method and apparatus for processing a micro sampleHITACHI LTD·Filed 2007·Granted Dec 16, 2008·20 cites·7 claims
- 1094US7222235B1Image processing system utilizing digital watermarks in predetermined regionsOKI ELECTRIC IND CO LTD·Filed 2000·Granted May 22, 2007·76 cites·87 claims
- 1194US4948962APlasma ion source mass spectrometerHITACHI LTD·Filed 1989·Granted Aug 14, 1990·67 cites·22 claims
- 1293US12139949B2HingeMITSUBISHI STEEL MFG·Filed 2020·Granted Nov 12, 2024·5 cites·10 claims
- 1392US7888639B2Method and apparatus for processing a micro sampleHITACHI LTD·Filed 2007·Granted Feb 15, 2011·14 cites·2 claims
- 1492US5485016AAtmospheric pressure ionization mass spectrometerHITACHI LTD·Filed 1994·Granted Jan 16, 1996·90 cites·29 claims
- 1591US5866905AElectron microscopeHITACHI LTD·Filed 1996·Granted Feb 2, 1999·74 cites·12 claims
- 1690US8713758B2Opening/closing deviceMITSUI YASUHIRO·Filed 2011·Granted May 6, 2014·21 cites·4 claims
- 1790US6051834AElectron microscopeHITACHI LTD·Filed 1998·Granted Apr 18, 2000·65 cites·2 claims
- 1889US9413971B2Opening and closing device, and electronic deviceMITSUBISHI STEEL MFG·Filed 2015·Granted Aug 9, 2016·6 cites·11 claims
- 1989US8222618B2Method and apparatus for processing a microsampleTOKUDA MITSUO·Filed 2011·Granted Jul 17, 2012·9 cites·18 claims
- 2089US7553334B2Defective product inspection apparatus, probe positioning method and probe moving methodHITACHI HIGH TECH CORP·Filed 2007·Granted Jun 30, 2009·9 cites·9 claims
- 2188US8618520B2Method and apparatus for processing a micro sampleTOKUDA MITSUO·Filed 2012·Granted Dec 31, 2013·7 cites·24 claims
- 2286US5168224ADetecting method and apparatus of specific substanceHITACHI LTD·Filed 1989·Granted Dec 1, 1992·52 cites·26 claims
- 2385US6881597B2Method of manufacturing a semiconductor device to provide a plurality of test element groups (TEGs) in a scribe regionRENESAS TECH CORP·Filed 2002·Granted Apr 19, 2005·39 cites·6 claims
- 2484US5304797AGas analyzer for determining impurity concentration of highly-purified gasHITACHI LTD·Filed 1993·Granted Apr 19, 1994·47 cites·22 claims
- 2583US5877498AMethod and apparatus for X-ray analysesHITACHI LTD·Filed 1997·Granted Mar 2, 1999·42 cites·20 claims
- 2683US4769540AAtmospheric pressure ionization mass spectrometerHITACHI LTD·Filed 1986·Granted Sep 6, 1988·25 cites·4 claims
- 2782US7663104B2Specimen inspection equipment and how to make electron beam absorbed current imagesHITACHI HIGH TECH CORP·Filed 2008·Granted Feb 16, 2010·6 cites·8 claims
- 2879US7297945B2Defective product inspection apparatus, probe positioning method and probe moving methodHITACHI HIGH TECH CORP·Filed 2004·Granted Nov 20, 2007·18 cites·20 claims
- 2978US5552602AElectron microscopeHITACHI LTD·Filed 1995·Granted Sep 3, 1996·41 cites·28 claims
- 3078US4996422AMass spectrometerHITACHI LTD·Filed 1989·Granted Feb 26, 1991·22 cites·11 claims
- 3173US7346375B2Rotating mechanism of biaxial hinge and portable telephone with the sameMITSUBISHI STEEL MFG·Filed 2004·Granted Mar 18, 2008·19 cites·11 claims
- 3273US5744800ADefect observing electron microscopeHITACHI LTD·Filed 1995·Granted Apr 28, 1998·27 cites·22 claims
- 3373US5475218AInstrument and method for 3-dimensional atomic arrangement observationHITACHI LTD·Filed 1993·Granted Dec 12, 1995·21 cites·8 claims
- 3471US5278408AInstrument and method for 3-dimensional atomic arrangement observationHITACHI LTD·Filed 1992·Granted Jan 11, 1994·27 cites·9 claims
- 3569US8178840B2Specimen inspection equipment and how to make the electron beam absorbed current imagesOBUKI TOMOHARU·Filed 2010·Granted May 15, 2012·2 cites·5 claims
- 3669US7506608B2Hinge mechanismMITSUBISHI STEEL MFG·Filed 2004·Granted Mar 24, 2009·11 cites·3 claims
- 3769US5594246AMethod and apparatus for x-ray analysesHITACHI LTD·Filed 1995·Granted Jan 14, 1997·21 cites·75 claims
- 3867US8662753B2Slide device for electronic deviceMITSUI YASUHIRO·Filed 2011·Granted Mar 4, 2014·2 cites·7 claims
- 3964US6120227ASelf-aligning boltAOYAMA SEISAKUSHO·Filed 1999·Granted Sep 19, 2000·28 cites·4 claims
- 4064US5482524AAtmospheric pressure, elevated temperature gas desorption apparatusHITACHI LTD·Filed 1994·Granted Jan 9, 1996·28 cites·12 claims
- 4164US5190039AApparatus and method for monitoring body organsHITACHI LTD·Filed 1990·Granted Mar 2, 1993·106 cites·17 claims
- 4259US12412806B2Elastic member and elastic deviceMITSUBISHI STEEL MFG·Filed 2023·Granted Sep 9, 2025·0 cites·11 claims
- 4358US12326168B2Opening and closing mechanismMITSUBISHI STEEL MFG·Filed 2022·Granted Jun 10, 2025·0 cites·18 claims
- 4457US4735777AInstrument for parallel analysis of metabolites in human urine and expired airHITACHI LTD·Filed 1986·Granted Apr 5, 1988·51 cites·15 claims
- 4553US9696755B2Opening and closing device, and electronic deviceMITSUBISHI STEEL MFG·Filed 2015·Granted Jul 4, 2017·0 cites·7 claims
- 4651US7038767B2Three-dimensional micropattern profile measuring system and methodHITACHI HIGH TECH CORP·Filed 2002·Granted May 2, 2006·3 cites·4 claims
- 4751US2007228180A1Access controlling method of non-contact communication electronic device, and non-contact communication electronic deviceOKI ELECTRIC IND CO LTD·Filed 2007·Application pending·0 cites
- 4850US5148022AMethod for optically inspecting human body and apparatus for the sameHITACHI LTD·Filed 1990·Granted Sep 15, 1992·56 cites·16 claims
- 4949US9398708B2Opening and closing deviceMITSUBISHI STEEL MFG·Filed 2013·Granted Jul 19, 2016·0 cites·9 claims
- 5049US8714822B2Opening/closing mechanismMITSUI YASUHIRO·Filed 2011·Granted May 6, 2014·0 cites·5 claims
Showing the top 50 of 67 patent records by PatentIndex Score.
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