Inventor · disambiguated record
Atsushi Someya
Also filed as: SOMEYA ATSUSHI
13 granted patents·1 pending application·312 citations·filing 1976–2008
93Inventor score
Top patents by PatentIndex Score
14 records- 0192US4872743AVarifocal optical elementCANON KK·Filed 1988·Granted Oct 10, 1989·92 cites·9 claims
- 0284US4729641AFunctional optical element having a non-flat planar interface with variable-index mediumCANON KK·Filed 1987·Granted Mar 8, 1988·55 cites·9 claims
- 0377US4848879ALight modulating deviceCANON KK·Filed 1987·Granted Jul 18, 1989·39 cites·19 claims
- 0470US4132463AZoom optical systemCANON KK·Filed 1976·Granted Jan 2, 1979·26 cites·15 claims
- 0569US7094994B2Heat treatment apparatus and method of semiconductor waferSONY CORP·Filed 2004·Granted Aug 22, 2006·13 cites·9 claims
- 0667US5883700AMethod for projection exposure to lightSONY CORP·Filed 1995·Granted Mar 16, 1999·27 cites·7 claims
- 0764US8519659B2Electric servo-press, and control device and control method for electric servo pressSOMEYA ATSUSHI·Filed 2008·Granted Aug 27, 2013·3 cites·15 claims
- 0855US4571032AZoom lensCANON KK·Filed 1981·Granted Feb 18, 1986·13 cites·7 claims
- 0952US4256371AZoom lens with extended variable focal length rangeCANON KK·Filed 1979·Granted Mar 17, 1981·11 cites·9 claims
- 1050US5311282AHigh precision stepping aligner having a spiral stepping patternSONY CORP·Filed 1992·Granted May 10, 1994·10 cites·6 claims
- 1146US4306776AZoom lens having three movable lens groupsCANON KK·Filed 1979·Granted Dec 22, 1981·9 cites·5 claims
- 1240US4641920AOptical element having the function of changing the cross-sectional intensity distribution of a light beamCANON KK·Filed 1984·Granted Feb 10, 1987·8 cites·9 claims
- 1337US4865426AVariable aberration imaging optical systemCANON KK·Filed 1988·Granted Sep 12, 1989·6 cites·6 claims
- 1434US2004241596A1Method of forming resist patterns and method of producing semiconductor deviceFiled 2004·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →