Inventor · disambiguated record
Edwin L. Strickland, Iii
Also filed as: STRICKLAND III EDWIN L
2 granted patents·1 pending application·56 citations·filing 1993–2008
65Inventor score
Top patents by PatentIndex Score
3 records- 0182US7775715B2Method of calibration for computed tomography scanners utilized in quality control applicationsUNITED TECHNOLOGIES CORP·Filed 2008·Granted Aug 17, 2010·16 cites·15 claims
- 0266US5400381AProcess for analyzing the contents of containersSCIENT MEASUREMENT SYSTEMS INC·Filed 1993·Granted Mar 21, 1995·40 cites·23 claims
- 0339US2009274264A1Computed Tomography Systems and Related Methods Involving Localized BiasUNITED TECHNOLOGIES CORP·Filed 2008·Application pending·0 cites
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