Inventor · disambiguated record
Geon Se Chang
Also filed as: CHANG GEON SE
11 granted patents·2 pending applications·9 citations·filing 2013–2015
82Inventor score
Files withSAMSUNG ELECTRO MECH13
Top patents by PatentIndex Score
13 records- 0180US9042106B2Thin film type chip device and method for manufacturing the sameSAMSUNG ELECTRO MECH·Filed 2013·Granted May 26, 2015·4 cites·11 claims
- 0277US9153957B2Electrostatic discharge protection device and method for manufacturing the sameSAMSUNG ELECTRO MECH·Filed 2013·Granted Oct 6, 2015·1 cites·12 claims
- 0372US9786428B2Common mode filter and method of manufacturing the sameSAMSUNG ELECTRO MECH·Filed 2014·Granted Oct 10, 2017·2 cites·4 claims
- 0470US9659709B2Common mode filter and manufacturing method thereofSAMSUNG ELECTRO MECH·Filed 2015·Granted May 23, 2017·1 cites·10 claims
- 0569US9991866B2Common mode filter, signal passing module and method of manufacturing common mode filterSAMSUNG ELECTRO MECH·Filed 2015·Granted Jun 5, 2018·1 cites·30 claims
- 0655US9082536B2Common mode filterSAMSUNG ELECTRO MECH·Filed 2013·Granted Jul 14, 2015·0 cites·10 claims
- 0752US9577598B2Thin film type common mode filterSAMSUNG ELECTRO MECH·Filed 2013·Granted Feb 21, 2017·0 cites·7 claims
- 0851US10062493B2Electronic component and circuit board having the same mounted thereonSAMSUNG ELECTRO MECH·Filed 2014·Granted Aug 28, 2018·0 cites·24 claims
- 0949US9496845B2Common mode filter and method for manufacturing the sameSAMSUNG ELECTRO MECH·Filed 2014·Granted Nov 15, 2016·0 cites·7 claims
- 1048US2014176283A1Common mode filter and method of manufacturing the sameSAMSUNG ELECTRO MECH·Filed 2013·Application pending·0 cites
- 1147US9077173B2Common mode filterSAMSUNG ELECTRO MECH·Filed 2013·Granted Jul 7, 2015·0 cites·21 claims
- 1247US2014176277A1Common mode filter having signal compensation functionSAMSUNG ELECTRO MECH·Filed 2013·Application pending·0 cites
- 1345US9906203B2Common mode filter and electronic device including the sameSAMSUNG ELECTRO MECH·Filed 2014·Granted Feb 27, 2018·0 cites·24 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →