Inventor · disambiguated record
Robert Moreland
Also filed as: MORELAND ROBERT · MORELAND ROBERT L
5 granted patents·145 citations·filing 2000–2005
83Inventor score
Top patents by PatentIndex Score
5 records- 0187US7285963B2Method and system for measurement of dielectric constant of thin films using a near field microwave probeSOLID STATE MEASUREMENTS INC·Filed 2005·Granted Oct 23, 2007·19 cites·20 claims
- 0287US6597185B1Apparatus for localized measurements of complex permittivity of a materialNEOCERA INC·Filed 2000·Granted Jul 22, 2003·62 cites·19 claims
- 0379US6680617B2Apertured probes for localized measurements of a material's complex permittivity and fabrication methodNEOCERA INC·Filed 2002·Granted Jan 20, 2004·27 cites·19 claims
- 0475US6856140B2System and method for quantitative measurements of a material's complex permittivity with use of near-field microwave probesNEOCERA INC·Filed 2003·Granted Feb 15, 2005·25 cites·21 claims
- 0568US6959481B2Apertured probes for localized measurements of a material's complex permittivity and fabrication methodNEOCERA INC·Filed 2003·Granted Nov 1, 2005·12 cites·9 claims
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