Inventor · disambiguated record
Roland Frech
Also filed as: FRECH ROLAND
27 granted patents·1 pending application·254 citations·filing 1995–2017
96Inventor score
Top patents by PatentIndex Score
28 records- 0190US6967398B2Module power distribution networkIBM·Filed 2005·Granted Nov 22, 2005·21 cites·17 claims
- 0286US9581631B2Determining the current return path integrity in an electric device connected or connectable to a further deviceIBM·Filed 2016·Granted Feb 28, 2017·2 cites·18 claims
- 0386US6535075B2Tunable on-chip capacityIBM·Filed 2000·Granted Mar 18, 2003·43 cites·14 claims
- 0483US6424058B1Testable on-chip capacityIBM·Filed 2000·Granted Jul 23, 2002·29 cites·14 claims
- 0580US9134364B2Determining the current return path integrity in an electric device connected or connectable to a further deviceFRECH ROLAND·Filed 2012·Granted Sep 15, 2015·3 cites·3 claims
- 0675US9304158B2Determining the current return path integrity in an electric device connected or connectable to a further deviceIBM·Filed 2015·Granted Apr 5, 2016·1 cites·20 claims
- 0774US6665843B2Method and system for quantifying the integrity of an on-chip power supply networkIBM·Filed 2002·Granted Dec 16, 2003·20 cites·14 claims
- 0870US8659310B2Method and system for performing self-tests in an electronic systemECKERT MARTIN·Filed 2011·Granted Feb 25, 2014·2 cites·20 claims
- 0968US7355125B2Printed circuit board and chip moduleIBM·Filed 2005·Granted Apr 8, 2008·4 cites·1 claims
- 1067US5914533AMultilayer module with thinfilm redistribution areaIBM·Filed 1995·Granted Jun 22, 1999·35 cites·7 claims
- 1167US5812380AMesh planes for multilayer moduleIBM·Filed 1995·Granted Sep 22, 1998·34 cites·10 claims
- 1266US7250812B2Integrated circuit current regulatorIBM·Filed 2005·Granted Jul 31, 2007·4 cites·13 claims
- 1365US8248082B2Method for determining the current return path integrity in an electric device connected or connectable to a further deviceFRECH ROLAND·Filed 2007·Granted Aug 21, 2012·3 cites·14 claims
- 1462US8866504B2Determining local voltage in an electronic systemECKERT MARTIN·Filed 2011·Granted Oct 21, 2014·1 cites·14 claims
- 1562US8222535B2Noise reducing circuit arrangementFRECH ROLAND·Filed 2008·Granted Jul 17, 2012·2 cites·21 claims
- 1661US9891256B2Determining the current return path integrity in an electric device connected or connectable to a further deviceIBM·Filed 2017·Granted Feb 13, 2018·0 cites·17 claims
- 1761US8271220B2Evaluating high frequency time domain in embedded device probingDIEPENBROCK JOSEPH CURTIS·Filed 2011·Granted Sep 18, 2012·1 cites·14 claims
- 1860US8000916B2System and method for evaluating high frequency time domain in embedded device probingIBM·Filed 2008·Granted Aug 16, 2011·2 cites·7 claims
- 1958US6043724ATwo-stage power noise filter with on and off chip capacitorsIBM·Filed 1998·Granted Mar 28, 2000·23 cites·5 claims
- 2056US9709625B2Measuring power consumption in an integrated circuitECKERT MARTIN·Filed 2011·Granted Jul 18, 2017·1 cites·10 claims
- 2154US6437252B2Method and structure for reducing power noiseIBM·Filed 2000·Granted Aug 20, 2002·6 cites·18 claims
- 2249US8645091B2Evaluating high frequency time domain in embedded device probingDIEPENBROCK JOSEPH CURTIS·Filed 2012·Granted Feb 4, 2014·0 cites·20 claims
- 2345US9094306B2Network power fault detectionIBM·Filed 2013·Granted Jul 28, 2015·0 cites·11 claims
- 2445US5956563AMethod for reducing a transient thermal mismatchIBM·Filed 1995·Granted Sep 21, 1999·13 cites·10 claims
- 2544US7742315B2Circuit on a printed circuit boardIBM·Filed 2005·Granted Jun 22, 2010·1 cites·4 claims
- 2643US8519720B2Method and system for impedance measurement in an integrated CircuitFRECH ROLAND·Filed 2011·Granted Aug 27, 2013·0 cites·25 claims
- 2741US6774836B2Method for delta-noise reductionIBM·Filed 2003·Granted Aug 10, 2004·3 cites·9 claims
- 2839US2003088395A1Method and system for quantifying dynamic on-chip power disributionFiled 2002·Application pending·0 cites
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