Inventor · disambiguated record
Mototsugu Okushima
Also filed as: OKUSHIMA MOTOTSUGU
31 granted patents·5 pending applications·353 citations·filing 1999–2018
97Inventor score
Files withOKUSHIMA MOTOTSUGU15NEC ELECTRONICS CORP7RENESAS ELECTRONICS CORP7NEC CORP6KOBAYASHI SUSUMU1
Top patents by PatentIndex Score
36 records- 0197US7294542B2Method of fabricating a semiconductor device having CMOS transistors and a bipolar transistorNEC ELECTRONICS CORP·Filed 2006·Granted Nov 13, 2007·81 cites·6 claims
- 0291US8395234B2Semiconductor deviceOKUSHIMA MOTOTSUGU·Filed 2010·Granted Mar 12, 2013·12 cites·7 claims
- 0389US7352547B2Semiconductor integrated circuit deviceNEC ELECTRONICS CORP·Filed 2006·Granted Apr 1, 2008·16 cites·14 claims
- 0489US6346471B1Multilayer wiring structure and semiconductor device having the same, and manufacturing method thereforNEC CORP·Filed 2000·Granted Feb 12, 2002·47 cites·11 claims
- 0588US8625239B2Semiconductor deviceOKUSHIMA MOTOTSUGU·Filed 2011·Granted Jan 7, 2014·10 cites·18 claims
- 0686US8248742B2Semiconductor deviceOKUSHIMA MOTOTSUGU·Filed 2010·Granted Aug 21, 2012·7 cites·9 claims
- 0784US7853909B2ESD analysis device and ESD analysis program used for designing semiconductor device and method of designing semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2007·Granted Dec 14, 2010·12 cites·20 claims
- 0884US7067884B2Electrostatic discharge deviceNEC ELECTRONICS CORP·Filed 2003·Granted Jun 27, 2006·33 cites·8 claims
- 0982US8310010B2Semiconductor deviceOKUSHIMA MOTOTSUGU·Filed 2010·Granted Nov 13, 2012·5 cites·19 claims
- 1080US8194369B2Semiconductor integrated circuitOKUSHIMA MOTOTSUGU·Filed 2008·Granted Jun 5, 2012·7 cites·10 claims
- 1180US7843008B2Semiconductor deviceNEC ELECTRONICS CORP·Filed 2007·Granted Nov 30, 2010·6 cites·10 claims
- 1280US6163075AMultilayer wiring structure and semiconductor device having the same, and manufacturing method thereforNEC CORP·Filed 1999·Granted Dec 19, 2000·51 cites·8 claims
- 1379US9076654B2Semiconductor deviceOKUSHIMA MOTOTSUGU·Filed 2012·Granted Jul 7, 2015·4 cites·3 claims
- 1478US8283728B2Semiconductor deviceOKUSHIMA MOTOTSUGU·Filed 2010·Granted Oct 9, 2012·4 cites·10 claims
- 1575US7183612B2Semiconductor device having an electrostatic discharge protecting elementNEC ELECTRONICS CORP·Filed 2004·Granted Feb 27, 2007·19 cites·29 claims
- 1674US9712165B2Semiconductor device including electrostatic protection circuitOKUSHIMA MOTOTSUGU·Filed 2011·Granted Jul 18, 2017·3 cites·20 claims
- 1773US9450089B2Semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2015·Granted Sep 20, 2016·2 cites·10 claims
- 1872US8230373B2ESD analysis device and ESD analysis program used for designing semiconductor device and method of designing semiconductor deviceKOBAYASHI SUSUMU·Filed 2010·Granted Jul 24, 2012·3 cites·4 claims
- 1969US8786048B2Semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2013·Granted Jul 22, 2014·2 cites·14 claims
- 2068US8125749B2Electrostatic protection circuitOKUSHIMA MOTOTSUGU·Filed 2010·Granted Feb 28, 2012·2 cites·13 claims
- 2168US8072720B2Electrostatic protection circuitOKUSHIMA MOTOTSUGU·Filed 2008·Granted Dec 6, 2011·3 cites·15 claims
- 2264US8643112B2Semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2012·Granted Feb 4, 2014·1 cites·18 claims
- 2364US7859808B2Electrostatic protection circuitRENESAS ELECTRONICS CORP·Filed 2008·Granted Dec 28, 2010·2 cites·6 claims
- 2462US7112852B2Semiconductor deviceNEC ELECTRONICS CORP·Filed 2002·Granted Sep 26, 2006·10 cites·10 claims
- 2561US7629210B2Method for fabricating an ESD protection apparatus for discharging electric charge in a depth directionNEC CORP·Filed 2007·Granted Dec 8, 2009·2 cites·13 claims
- 2656US2019140641A1Semiconductor device including electrostatic protection circuitRENESAS ELECTRONICS CORP·Filed 2018·Application pending·0 cites
- 2754US10218356B2Semiconductor device including electrostatic protection circuitRENESAS ELECTRONICS CORP·Filed 2017·Granted Feb 26, 2019·0 cites·11 claims
- 2852US7538995B2Semiconductor integrated circuit deviceNEC ELECTRONICS CORP·Filed 2004·Granted May 26, 2009·5 cites·5 claims
- 2951US8558314B2Semiconductor deviceOKUSHIMA MOTOTSUGU·Filed 2012·Granted Oct 15, 2013·0 cites·10 claims
- 3050US6512663B1Electrostatic protection device and electrostatic protection circuitNEC CORP·Filed 2000·Granted Jan 28, 2003·4 cites·5 claims
- 3149US8072032B2Semiconductor integrated circuit device having latchup preventing functionOKUSHIMA MOTOTSUGU·Filed 2007·Granted Dec 6, 2011·0 cites·10 claims
- 3248US8198688B2Semiconductor integrated circuit device with MOSFET limiter circuitOKUSHIMA MOTOTSUGU·Filed 2010·Granted Jun 12, 2012·0 cites·4 claims
- 3347US2012243134A1Semiconductor integrated circuitOKUSHIMA MOTOTSUGU·Filed 2012·Application pending·0 cites
- 3445US2012050927A1Electrostatic protection circuitOKUSHIMA MOTOTSUGU·Filed 2011·Application pending·0 cites
- 3537US2002113317A1A semiconductor device having hydogen diffusion and barrier layers and a method of producing the sameNEC CORP·Filed 2002·Application pending·0 cites
- 3637US2001043449A1ESD protection apparatus and method for fabricating the sameNEC CORP·Filed 2001·Application pending·0 cites
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