Inventor · disambiguated record
Takahiro Nishihata
Also filed as: NISHIHATA TAKAHIRO
5 granted patents·1 pending application·3 citations·filing 2018–2023
64Inventor score
Files withHITACHI HIGH TECH CORP6
Top patents by PatentIndex Score
6 records- 0178US11545336B2Scanning electron microscopy system and pattern depth measurement methodHITACHI HIGH TECH CORP·Filed 2019·Granted Jan 3, 2023·2 cites·5 claims
- 0277US11302513B2Electron microscope apparatus, inspection system using electron microscope apparatus, and inspection method using electron microscope apparatusHITACHI HIGH TECH CORP·Filed 2019·Granted Apr 12, 2022·1 cites·8 claims
- 0364US12243711B2Method, apparatus, and program for determining condition related to captured image of charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2022·Granted Mar 4, 2025·0 cites·28 claims
- 0456US2024112322A1Semiconductor Observation System and Overlay Measurement MethodHITACHI HIGH TECH CORP·Filed 2023·Application pending·0 cites
- 0555US12142457B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Nov 12, 2024·0 cites·15 claims
- 0641US11355304B2Electronic microscope deviceHITACHI HIGH TECH CORP·Filed 2018·Granted Jun 7, 2022·0 cites·15 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →