Inventor · disambiguated record
Atsushi Tsukazaki
Also filed as: TSUKAZAKI ATSUSHI
6 granted patents·19 pending applications·12 citations·filing 2004–2022
73Inventor score
Top patents by PatentIndex Score
25 records- 0181US7741637B2ZnO-based semiconductor deviceROHM CO LTD·Filed 2007·Granted Jun 22, 2010·8 cites·4 claims
- 0269US8247793B2ZnO-based thin film and ZnO-based semiconductor elementNAKAHARA KEN·Filed 2008·Granted Aug 21, 2012·3 cites·8 claims
- 0360US11543468B2Hall elementUNIV TOHOKU·Filed 2019·Granted Jan 3, 2023·0 cites·9 claims
- 0454US8759828B2ZnO-based semiconductor device and manufacturing method thereofAKASAKA SHUNSUKE·Filed 2012·Granted Jun 24, 2014·1 cites·19 claims
- 0554US2008187776A1Multilayer substrateROHM CO LTD·Filed 2008·Application pending·0 cites
- 0650US9053851B2Crystal and laminateJAPAN SCIENCE & TECH AGENCY·Filed 2012·Granted Jun 9, 2015·0 cites·11 claims
- 0749US2010308327A1ZnO-BASED SUBSTRATE, METHOD FOR PROCESSING ZnO-BASED SUBSTRATE, AND ZnO-BASED SEMICONDUCTOR DEVICENAKAHARA KEN·Filed 2009·Application pending·0 cites
- 0847US8410478B2p-Type MgZnO-based thin film and semiconductor light emitting deviceNAKAHARA KEN·Filed 2008·Granted Apr 2, 2013·0 cites·16 claims
- 0947US2008245297A1Material supply apparatusROHM CO LTD·Filed 2008·Application pending·0 cites
- 1047US2010133470A1ZnO-BASED SUBSTRATE AND METHOD OF TREATING ZnO-BASED SUBSTRATEROHM CO LTD·Filed 2008·Application pending·0 cites
- 1145US2010183045A1Substrate temperature measuring apparatus and substrate temperature measuring methodROHM CO LTD·Filed 2008·Application pending·0 cites
- 1245US2010237343A1ZnO-BASED THIN FILM AND SEMICONDUCTOR DEVICEROHM CO LTD·Filed 2008·Application pending·0 cites
- 1345US2011114938A1ZnO SEMICONDUCTOR ELEMENTROHM CO LTD·Filed 2009·Application pending·0 cites
- 1445US2009146541A1Infrared reflector and heating device having the sameROHM CO LTD·Filed 2008·Application pending·0 cites
- 1545US2025383413A1Magnetic sensor and magnetic detection methodUNIV TOHOKU·Filed 2022·Application pending·0 cites
- 1645US2011037067A1Zno-group semiconductor elementNAKAHARA KEN·Filed 2008·Application pending·0 cites
- 1744US2012181531A1Semiconductor element and manufacturing method of the sameNAKAHARA KEN·Filed 2008·Application pending·0 cites
- 1844US2010040534A1Radical generating apparatus and zno-based thin filmROHM CO LTD·Filed 2008·Application pending·0 cites
- 1944US2010090214A1Oxide thin film and oxide thin film deviceROHM CO LTD·Filed 2008·Application pending·0 cites
- 2044US2010323160A1ZnO-BASED THIN FILMROHM CO LTD·Filed 2008·Application pending·0 cites
- 2144US2011033718A1ZnO THIN FILMROHM CO LTD·Filed 2008·Application pending·0 cites
- 2244US2010270533A1ZnO-BASED SEMICONDUCTOR ELEMENTROHM CO LTD·Filed 2008·Application pending·0 cites
- 2343US2010102309A1ZNO-Based Semiconductor ElementROHM CO LTD·Filed 2008·Application pending·0 cites
- 2443US2010230671A1Zno-based semiconductor and zno-based semiconductor deviceNAKAHARA KEN·Filed 2008·Application pending·0 cites
- 2537US2008118769A1Method of Manufacturing Thin Film, Method of Manufacturing P-Type Zinc Oxide Thin Film and Semiconductor DeviceUNIV TOHOKU·Filed 2004·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →