Inventor · disambiguated record
Craig E. Uhrich
Also filed as: UHRICH CRAIG · UHRICH CRAIG E · UHRICH CRAIG EDWARD
22 granted patents·4 pending applications·479 citations·filing 2000–2025
96Inventor score
Files withTHERMA WAVE INC11COMPLETE GENOMICS INC7MGI TECH CO LTD4STAKER BRYAN P2KLA TENCOR TECH CORP1
Top patents by PatentIndex Score
26 records- 0197US8428454B2Method and system for imaging high density biochemical arrays with sub-pixel alignmentSTAKER BRYAN P·Filed 2012·Granted Apr 23, 2013·29 cites·26 claims
- 0297US8175452B1Method and system for imaging high density biochemical arrays with sub-pixel alignmentSTAKER BRYAN P·Filed 2010·Granted May 8, 2012·38 cites·13 claims
- 0396US6643354B2Calibration and alignment of X-ray reflectometric systemsTHERMA WAVE INC·Filed 2002·Granted Nov 4, 2003·78 cites·26 claims
- 0496US6453006B1Calibration and alignment of X-ray reflectometric systemsTHERMA WAVE INC·Filed 2000·Granted Sep 17, 2002·93 cites·19 claims
- 0595US8660421B2Method and system for imaging high density biochemical arrays with sub-pixel alignmentCOMPLETE GENOMICS INC·Filed 2013·Granted Feb 25, 2014·14 cites·7 claims
- 0694US6515746B2Thin film optical measurement system and method with calibrating ellipsometerTHERMA WAVE INC·Filed 2002·Granted Feb 4, 2003·42 cites·22 claims
- 0792US6987832B2Calibration and alignment of X-ray reflectometric systemsKLA TENCOR TECH CORP·Filed 2004·Granted Jan 17, 2006·39 cites·17 claims
- 0891US6934025B2Thin film optical measurement system and method with calibrating ellipsometerTHERMA WAVE INC·Filed 2004·Granted Aug 23, 2005·30 cites·19 claims
- 0990US6768785B2Calibration and alignment of X-ray reflectometric systemsTHERMA WAVE INC·Filed 2003·Granted Jul 27, 2004·32 cites·10 claims
- 1088US6744850B2X-ray reflectance measurement system with adjustable resolutionTHERMA WAVE INC·Filed 2001·Granted Jun 1, 2004·35 cites·33 claims
- 1187US8965196B2Method and system for imaging high density biochemical arrays with sub-pixel alignmentCOMPLETE GENOMICS INC·Filed 2014·Granted Feb 24, 2015·4 cites·8 claims
- 1281US9285578B2Method for imaging high density biochemical arrays with sub-pixel alignmentCOMPLETE GENOMICS INC·Filed 2015·Granted Mar 15, 2016·2 cites·8 claims
- 1378US6753962B2Thin film optical measurement system and method with calibrating ellipsometerTHERMA WAVE INC·Filed 2002·Granted Jun 22, 2004·12 cites·27 claims
- 1475US9488823B2Techniques for scanned illuminationCOMPLETE GENOMICS INC·Filed 2013·Granted Nov 8, 2016·2 cites·30 claims
- 1574US6829049B1Small spot spectroscopic ellipsometer with refractive focusingTHERMA WAVE INC·Filed 2001·Granted Dec 7, 2004·14 cites·29 claims
- 1673US2024426752A1Biochemical substance analysis system, method, and deviceMGI TECH CO LTD·Filed 2024·Application pending·0 cites
- 1772US9628676B2Imaging systems with movable scan mirrorsCOMPLETE GENOMICS INC·Filed 2013·Granted Apr 18, 2017·2 cites·12 claims
- 1870US9917990B2Imaging systems with movable scan mirrorsCOMPLETE GENOMICS INC·Filed 2017·Granted Mar 13, 2018·1 cites·16 claims
- 1964US6940596B2Refractive focusing element for spectroscopic ellipsometryTHERMA WAVE INC·Filed 2004·Granted Sep 6, 2005·7 cites·26 claims
- 2062US6707056B2Stage rotation system to improve edge measurementsTHERMA WAVE INC·Filed 2002·Granted Mar 16, 2004·3 cites·2 claims
- 2160US6885019B2Sample positioning system to improve edge measurementsTHERMA WAVE INC·Filed 2004·Granted Apr 26, 2005·2 cites·4 claims
- 2258US12117396B2Biochemical substance analysis system, method, and deviceMGI TECH CO LTD·Filed 2019·Granted Oct 15, 2024·0 cites·16 claims
- 2358US2025305959A1Optical analysis systems and methodsMGI TECH CO LTD·Filed 2025·Application pending·0 cites
- 2451US2017013220A1Techniques for scanned illuminationCOMPLETE GENOMICS INC·Filed 2016·Application pending·0 cites
- 2548US12235216B2Optical imaging system and biochemical substance detection system using sameMGI TECH CO LTD·Filed 2020·Granted Feb 25, 2025·0 cites·17 claims
- 2641US2007076976A1Methods for eliminating artifacts in two-dimensional optical metrologyUHRICH CRAIG·Filed 2006·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →