Inventor · disambiguated record

Jong-Kyu Han

Also filed as: HAN JONG-KYU

1 granted patent·11 citations·filing 2007–2007

33Inventor score

Technology areasG06V

Files withHANTECH CO LTD1

Top patents by PatentIndex Score

1 record

0162US8055058B2Apparatus and method for detecting defects in wafer using line sensor cameraHANTECH CO LTD·Filed 2007·Granted Nov 8, 2011·11 cites·33 claims

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