Inventor · disambiguated record
Hyoung-Young Lee
Also filed as: LEE HYOUNG-YOUNG
5 granted patents·1 pending application·23 citations·filing 2002–2013
76Inventor score
Top patents by PatentIndex Score
6 records- 0169US8604813B2Built-off test device and test system including the sameKWON HYUK·Filed 2010·Granted Dec 10, 2013·3 cites·12 claims
- 0259US7327154B2Multichip package testSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Feb 5, 2008·3 cites·4 claims
- 0357US7227351B2Apparatus and method for performing parallel test on integrated circuit devicesSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Jun 5, 2007·11 cites·20 claims
- 0454US6943577B2Multichip package testSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Sep 13, 2005·6 cites·2 claims
- 0546US9285415B2Built-off test device and test system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Mar 15, 2016·0 cites·6 claims
- 0629US2003115519A1Parallel testing system for semiconductor memory devicesSAMSUNG ELECTRONICS CO LTD·Filed 2002·Application pending·0 cites
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