Inventor · disambiguated record
Thomas J. Aton
Also filed as: ATON THOMAS · ATON THOMAS J · ATON THOMAS JOHN
58 granted patents·11 pending applications·1,515 citations·filing 1989–2018
99Inventor score
Files withTEXAS INSTRUMENTS INC51ATON THOMAS J8HOUSTON THEODORE W6ATON THOMAS JOHN2BALDWIN GREGORY CHARLES1
Top patents by PatentIndex Score
69 records- 0197US5751987ADistributed processing memory chip with embedded logic having both data memory and broadcast memoryTEXAS INSTRUMENTS INC·Filed 1995·Granted May 12, 1998·593 cites·12 claims
- 0295US6787469B2Double pattern and etch of poly with hard maskTEXAS INSTRUMENTS INC·Filed 2002·Granted Sep 7, 2004·99 cites·23 claims
- 0395US5159752AScanning electron microscope based parametric testing method and apparatusTEXAS INSTRUMENTS INC·Filed 1990·Granted Nov 3, 1992·130 cites·12 claims
- 0492US6634018B2Optical proximity correctionTEXAS INSTRUMENTS INC·Filed 2001·Granted Oct 14, 2003·48 cites·15 claims
- 0591US6764795B2Method and system for mask pattern correctionTEXAS INSTRUMENTS INC·Filed 2002·Granted Jul 20, 2004·46 cites·27 claims
- 0691US6635916B2On-chip capacitorTEXAS INSTRUMENTS INC·Filed 2001·Granted Oct 21, 2003·50 cites·13 claims
- 0789US7906253B2System and method for making photomasksTEXAS INSTRUMENTS INC·Filed 2007·Granted Mar 15, 2011·22 cites·12 claims
- 0888US7927782B2Simplified double mask patterning systemTEXAS INSTRUMENTS INC·Filed 2007·Granted Apr 19, 2011·13 cites·7 claims
- 0988US6897505B2On-chip capacitorTEXAS INSTRUMENTS INC·Filed 2003·Granted May 24, 2005·37 cites·11 claims
- 1085US10192859B2Integrated circuits and processes for protection of standard cell performance from context effectsATON THOMAS J·Filed 2012·Granted Jan 29, 2019·9 cites·13 claims
- 1185US8446175B2Logic-cell-compatible decoupling capacitorATON THOMAS JOHN·Filed 2011·Granted May 21, 2013·10 cites·20 claims
- 1285US7984393B2System and method for making photomasksTEXAS INSTRUMENTS INC·Filed 2007·Granted Jul 19, 2011·8 cites·7 claims
- 1385US7930656B2System and method for making photomasksTEXAS INSTRUMENTS INC·Filed 2007·Granted Apr 19, 2011·8 cites·11 claims
- 1485US5396141ARadioisotope power cellsTEXAS INSTRUMENTS INC·Filed 1993·Granted Mar 7, 1995·80 cites·5 claims
- 1585US5361137AProcess control for submicron linewidth measurementTEXAS INSTRUMENTS INC·Filed 1992·Granted Nov 1, 1994·56 cites·8 claims
- 1683US6553558B2Integrated circuit layout and verification methodTEXAS INSTRUMENTS INC·Filed 2000·Granted Apr 22, 2003·22 cites·14 claims
- 1782US7906271B2System and method for making photomasksTEXAS INSTRUMENTS INC·Filed 2007·Granted Mar 15, 2011·6 cites·2 claims
- 1881US5059897AMethod and apparatus for testing passive substrates for integrated circuit mountingTEXAS INSTRUMENTS INC·Filed 1989·Granted Oct 22, 1991·41 cites·31 claims
- 1979US11024620B2Integrated circuits and processes for protection of standard cell performance from context effectsTEXAS INSTRUMENTS INC·Filed 2018·Granted Jun 1, 2021·2 cites·14 claims
- 2079US7735056B2Automated circuit design dimension change responsive to low contrast condition determination in photomask phase patternTEXAS INSTRUMENTS INC·Filed 2006·Granted Jun 8, 2010·5 cites·27 claims
- 2178US9899364B2Method of forming a transistor with an active area layout having both wide and narrow area portions and a gate formed over the intersection of the twoTEXAS INSTRUMENTS INC·Filed 2015·Granted Feb 20, 2018·2 cites·16 claims
- 2276US8281262B2Partitioning features of a single IC layer onto multiple photolithographic masksATON THOMAS J·Filed 2009·Granted Oct 2, 2012·4 cites·16 claims
- 2375US6813757B2Method for evaluating a mask pattern on a substrateTEXAS INSTRUMENTS INC·Filed 2002·Granted Nov 2, 2004·14 cites·21 claims
- 2473US5128612ADisposable high performance test headTEXAS INSTRUMENTS INC·Filed 1990·Granted Jul 7, 1992·42 cites·17 claims
- 2568US8173544B2Integrated circuit having interleaved gridded features, mask set and method for printingATON THOMAS J·Filed 2008·Granted May 8, 2012·2 cites·7 claims
- 2667US7818711B2System and method for making photomasksTEXAS INSTRUMENTS INC·Filed 2007·Granted Oct 19, 2010·2 cites·13 claims
- 2767US7765516B2System and method for making photomasksTEXAS INSTRUMENTS INC·Filed 2007·Granted Jul 27, 2010·2 cites·13 claims
- 2866US10756095B2SRAM cell with T-shaped contactTEXAS INSTRUMENTS INC·Filed 2018·Granted Aug 25, 2020·0 cites·20 claims
- 2966US10748913B2SRAM cell with T-shaped contactTEXAS INSTRUMENTS INC·Filed 2018·Granted Aug 18, 2020·0 cites·24 claims
- 3066US8664968B2On-die parametric test modules for in-line monitoring of context dependent effectsBALDWIN GREGORY CHARLES·Filed 2010·Granted Mar 4, 2014·2 cites·16 claims
- 3165US6567346B2Absolute time scale clockTEXAS INSTRUMENTS INC·Filed 2001·Granted May 20, 2003·9 cites·27 claims
- 3264US8667432B2Gate CD control using local design on both sides of neighboring dummy gate level featuresTEXAS INSTRUMENTS INC·Filed 2013·Granted Mar 4, 2014·1 cites·4 claims
- 3363US9117775B2Alignment to multiple layersATON THOMAS JOHN·Filed 2012·Granted Aug 25, 2015·1 cites·7 claims
- 3463US8455180B2Gate CD control using local design on both sides of neighboring dummy gate level featuresBLATCHFORD JAMES WALTER·Filed 2010·Granted Jun 4, 2013·1 cites·7 claims
- 3562US5208531AApparatus and method for testing integrated circuitsTEXAS INSTRUMENTS INC·Filed 1990·Granted May 4, 1993·21 cites·18 claims
- 3661US7458058B2Verifying a process margin of a mask pattern using intermediate stage modelsTEXAS INSTRUMENTS INC·Filed 2005·Granted Nov 25, 2008·1 cites·18 claims
- 3756US4978908AScanning electron microscope based parametric testing method and apparatusTEXAS INSTRUMENTS INC·Filed 1989·Granted Dec 18, 1990·24 cites·6 claims
- 3854US8663879B2Gate CD control using local design on both sides of neighboring dummy gate level featuresTEXAS INSTRUMENTS INC·Filed 2013·Granted Mar 4, 2014·0 cites·4 claims
- 3954US6724431B1Program network specific information for TV or radioTEXAS INSTRUMENTS INC·Filed 1994·Granted Apr 20, 2004·14 cites·43 claims
- 4054US5053699AScanning electron microscope based parametric testing method and apparatusTEXAS INSTRUMENTS INC·Filed 1990·Granted Oct 1, 1991·15 cites·30 claims
- 4152US6635551B2Deep trench isolation for reducing soft errors in integrated circuitsTEXAS INSTRUMENTS INC·Filed 2002·Granted Oct 21, 2003·4 cites·22 claims
- 4251US9123562B2Layout method to minimize context effects and die areaTEXAS INSTRUMENTS INC·Filed 2012·Granted Sep 1, 2015·0 cites·9 claims
- 4350US9343332B2Alignment to multiple layersTEXAS INSTRUMENTS INC·Filed 2015·Granted May 17, 2016·0 cites·3 claims
- 4450US8580685B2Integrated circuit having interleaved gridded features, mask set, and method for printingATON THOMAS J·Filed 2012·Granted Nov 12, 2013·0 cites·17 claims
- 4550US8475976B2Method of fabricating integrated circuit using alternating phase-shift mask and phase-shift trim maskATON THOMAS J·Filed 2010·Granted Jul 2, 2013·0 cites·16 claims
- 4650US7263684B2Correcting a mask pattern by selectively updating the positions of specific segmentsTEXAS INSTRUMENTS INC·Filed 2004·Granted Aug 28, 2007·2 cites·25 claims
- 4749US8971084B2Context protection for a column interleaved memoryTEXAS INSTRUMENTS INC·Filed 2013·Granted Mar 3, 2015·1 cites·16 claims
- 4849US2012258593A1Sram cell with t-shaped contactHOUSTON THEODORE W·Filed 2012·Application pending·0 cites
- 4949US2012264294A1Sram cell with t-shaped contactHOUSTON THEODORE W·Filed 2012·Application pending·0 cites
- 5049US2012264293A1Sram cell with t-shaped contactHOUSTON THEODORE W·Filed 2012·Application pending·0 cites
Showing the top 50 of 69 patent records by PatentIndex Score.
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