Inventor · disambiguated record
Byoung-Woon Ahn
Also filed as: AHN BYOUNG-WOON
6 granted patents·3 pending applications·1 citations·filing 2010–2023
67Inventor score
Top patents by PatentIndex Score
9 records- 0176US12038455B2Measuring method for measuring heat distribution of specific space using SThM probe, method and device for detecting beam spot of light sourcePARK SYSTEMS CORP·Filed 2023·Granted Jul 16, 2024·0 cites·4 claims
- 0262US11598788B2Measuring method for measuring heat distribution of specific space using SThM probe, method and device for detecting beam spot of light sourcePARK SYSTEMS CORP·Filed 2021·Granted Mar 7, 2023·0 cites·3 claims
- 0359US8209766B2Scanning probe microscope capable of measuring samples having overhang structurePARK SANG-IL·Filed 2010·Granted Jun 26, 2012·1 cites·14 claims
- 0451US11619649B1Atomic force microscope equipped with optical measurement device and method of acquiring information on surface of measurement target using the samePARK SYSTEMS CORP·Filed 2021·Granted Apr 4, 2023·0 cites·12 claims
- 0549US12399195B2Method for measuring, by measurement device, characteristics of surface of object to be measured, atomic force microscope for performing same method, and computer program stored in storage medium to perform same methodPARK SYSTEMS CORP·Filed 2021·Granted Aug 26, 2025·0 cites·11 claims
- 0648US9645168B2Head limiting movement range of laser spot and atomic force microscope having the samePARK SYSTEMS CORP·Filed 2015·Granted May 9, 2017·0 cites·10 claims
- 0739US2023324434A1Method for measuring characteristics of surface of object to be measured by means of measuring apparatus using variable set point setting, atomic microscope for performing method, and computer program stored in storage medium for performing methodPARK SYSTEMS CORP·Filed 2021·Application pending·0 cites
- 0838US2023046236A1Method for obtaining characteristics of surface to be measured, by using inclined tip, atomic force microscope for performing method, and computer program stored in storage medium in order to perform methodPARK SYSTEMS CORP·Filed 2020·Application pending·0 cites
- 0932US2010218285A1Scanning probe microscope capable of measuring samples having overhang structurePARK SYSTEMS CORP·Filed 2010·Application pending·0 cites
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