Inventor · disambiguated record
Juergen Schloeffel
Also filed as: SCHLOEFFEL JUERGEN
3 granted patents·1 pending application·12 citations·filing 2008–2011
63Inventor score
Files withHAPKE FRIEDRICH4
Top patents by PatentIndex Score
4 records- 0170US8250420B2Testable integrated circuit and test data generation methodHAPKE FRIEDRICH·Filed 2008·Granted Aug 21, 2012·7 cites·17 claims
- 0260US8990760B2Cell-aware fault model generation for delay faultsHAPKE FRIEDRICH·Filed 2011·Granted Mar 24, 2015·2 cites·26 claims
- 0357US8423845B2On-chip logic to log failures during production testing and enable debugging for failure diagnosisHAPKE FRIEDRICH·Filed 2009·Granted Apr 16, 2013·3 cites·12 claims
- 0433US2010229061A1Cell-Aware Fault Model Creation And Pattern GenerationHAPKE FRIEDRICH·Filed 2010·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →