Inventor · disambiguated record
Kiyomi Yoshinari
Also filed as: YOSHINARI KIYOMI
36 granted patents·8 pending applications·478 citations·filing 1995–2020
97Inventor score
Top patents by PatentIndex Score
44 records- 0195US7473892B2Mass spectrometer systemHITACHI HIGH TECH CORP·Filed 2004·Granted Jan 6, 2009·72 cites·29 claims
- 0292US6745134B2Mass spectrometric data analyzing method, mass spectrometric data analyzing apparatus, mass spectrometric data analyzing program, and solution offering systemHITACHI LTD·Filed 2003·Granted Jun 1, 2004·29 cites·10 claims
- 0391US7595484B2Mass spectrometric method, mass spectrometric system, diagnosis system, inspection system, and mass spectrometric programHITACHI HIGH TECH CORP·Filed 2005·Granted Sep 29, 2009·16 cites·18 claims
- 0487US7064319B2Mass spectrometerAPPLERA CORP·Filed 2003·Granted Jun 20, 2006·27 cites·11 claims
- 0586US6917037B2Mass spectrum analyzing systemHITACHI HIGH TECH CORP·Filed 2004·Granted Jul 12, 2005·22 cites·23 claims
- 0686US6907352B2Mass spectrometric data analyzing method, mass spectrometric data analyzing apparatus, mass spectrometric data analyzing program, and solution offering systemHITACHI LTD·Filed 2002·Granted Jun 14, 2005·10 cites·15 claims
- 0786US6541769B1Mass spectrometerHITACHI LTD·Filed 2000·Granted Apr 1, 2003·25 cites·17 claims
- 0885US7932486B2Mass spectrometer systemHITACHI HIGH TECH CORP·Filed 2008·Granted Apr 26, 2011·7 cites·6 claims
- 0985US7180056B2Mass spectrometry and mass spectrometry systemHITACHI LTD·Filed 2005·Granted Feb 20, 2007·11 cites·10 claims
- 1084US6043491AScanning electron microscopeHITACHI LTD·Filed 1998·Granted Mar 28, 2000·44 cites·6 claims
- 1183US7158893B2Mass spectrometric data analyzing method, mass spectrometric data analyzing apparatus, mass spectrometric data analyzing program, and solution offering systemHITACHI LTD·Filed 2004·Granted Jan 2, 2007·6 cites·4 claims
- 1282US6759652B2Ion trap mass analyzing apparatusHITACHI HIGH TECH CORP·Filed 2002·Granted Jul 6, 2004·16 cites·12 claims
- 1381US6977373B2Ion trap mass analyzing apparatusHITACHI HIGH TECH CORP·Filed 2004·Granted Dec 20, 2005·14 cites·5 claims
- 1480US6121610AIon trap mass spectrometerHITACHI LTD·Filed 1998·Granted Sep 19, 2000·34 cites·17 claims
- 1579US7053367B2Mass spectrometerHITACHI HIGH TECH CORP·Filed 2001·Granted May 30, 2006·15 cites·17 claims
- 1677US6914239B2System for analyzing mass spectrometric dataHITACHI HIGH TECH CORP·Filed 2003·Granted Jul 5, 2005·13 cites·19 claims
- 1776US6852972B2Mass spectrometerHITACHI HIGH TECH CORP·Filed 2003·Granted Feb 8, 2005·11 cites·4 claims
- 1874US5756993AMass spectrometerHITACHI LTD·Filed 1996·Granted May 26, 1998·26 cites·24 claims
- 1973US11049706B2Mass spectrometer and nozzle memberHITACHI HIGH TECH CORP·Filed 2018·Granted Jun 29, 2021·1 cites·14 claims
- 2071US6683303B2Ion trap mass spectrometer and spectrometryHITACHI LTD·Filed 2002·Granted Jan 27, 2004·8 cites·15 claims
- 2170US10607825B2Mass spectrometerHITACHI HIGH TECH CORP·Filed 2016·Granted Mar 31, 2020·1 cites·13 claims
- 2270US7544930B2Tandem type mass analysis system and methodHITACHI HIGH TECH CORP·Filed 2007·Granted Jun 9, 2009·2 cites·20 claims
- 2370US7126113B2Mass spectrometry systemHITACHI HIGH TECH CORP·Filed 2005·Granted Oct 24, 2006·2 cites·21 claims
- 2470US5623144AMass spectrometer ring-shaped electrode having high ion selection efficiency and mass spectrometry method therebyHITACHI LTD·Filed 1996·Granted Apr 22, 1997·23 cites·26 claims
- 2568US6633033B2Apparatus for mass spectrometry on an ion-trap methodHITACHI LTD·Filed 2000·Granted Oct 14, 2003·6 cites·16 claims
- 2665US7435949B2Mass spectrometric analysis method and system using the methodHITACHI HIGH TECH CORP·Filed 2006·Granted Oct 14, 2008·1 cites·17 claims
- 2765US6957159B2System for analyzing compound structureHITACHI HIGH TECH CORP·Filed 2003·Granted Oct 18, 2005·6 cites·20 claims
- 2865US6140641AIon-trap mass analyzing apparatus and ion trap mass analyzing methodHITACHI LTD·Filed 1998·Granted Oct 31, 2000·17 cites·13 claims
- 2959US7075069B2Apparatus for mass spectrometry on an ion-trap methodHITACHI LTD·Filed 2003·Granted Jul 11, 2006·3 cites·20 claims
- 3054US5532483AMass spectrometer and ion sourceHITACHI LTD·Filed 1995·Granted Jul 2, 1996·10 cites·11 claims
- 3151US11955327B2Ion detectorHITACHI HIGH TECH CORP·Filed 2020·Granted Apr 9, 2024·0 cites·14 claims
- 3250US7332713B2Mass spectrometric method and mass spectrometric systemHITACHI LTD·Filed 2005·Granted Feb 19, 2008·0 cites·20 claims
- 3348US12087565B2Mass spectrometerHITACHI HIGH TECH CORP·Filed 2019·Granted Sep 10, 2024·0 cites·11 claims
- 3447US2004050974A1Valve-encased nozzle device and liquid handling deviceFiled 2003·Application pending·0 cites
- 3546US10332736B2Mass spectrometer with ion frequency selectionHITACHI HIGH TECH CORP·Filed 2014·Granted Jun 25, 2019·0 cites·17 claims
- 3646US2007221836A1Mass analysis systemKOBAYASHI KINYA·Filed 2007·Application pending·0 cites
- 3744US10068756B2Mass spectrometerHITACHI HIGH TECH CORP·Filed 2015·Granted Sep 4, 2018·0 cites·8 claims
- 3843US10229821B2Mass spectrometry deviceHITACHI HIGH TECH CORP·Filed 2016·Granted Mar 12, 2019·0 cites·12 claims
- 3943US2011101215A1Quantitative analysis method using mass spectrometerHIRABAYASHI ATSUMU·Filed 2009·Application pending·0 cites
- 4041US2014200845A1Numerical Analysis SystemYOSHINARI KIYOMI·Filed 2011·Application pending·0 cites
- 4139US2014337402A1Analysis Computation Method, Analysis Computation Program and Recording MediumTAGO KAZUTAMI·Filed 2011·Application pending·0 cites
- 4238US2002125421A1Mass spectrometerFiled 2002·Application pending·0 cites
- 4336US2002195556A1Mass spectrometerHITACHI LTD·Filed 2002·Application pending·0 cites
- 4436US2002005479A1Ion trap mass spectrometer and it's mass spectrometry methodFiled 2001·Application pending·0 cites
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