Inventor · disambiguated record
Kamran Zarrineh
Also filed as: ZARRINEH KAMRAN · ZARRINEH KAMRAN K
19 granted patents·1 pending application·506 citations·filing 1996–2013
96Inventor score
Top patents by PatentIndex Score
20 records- 0194US7168005B2Programable multi-port memory BIST with compact microcodeCADENCE DESIGN SYSTEMS INC·Filed 2003·Granted Jan 23, 2007·91 cites·41 claims
- 0292US6557127B1Method and apparatus for testing multi-port memoriesCADENCE DESIGN SYSTEMS INC·Filed 2000·Granted Apr 29, 2003·67 cites·18 claims
- 0388US7178076B1Architecture of an efficient at-speed programmable memory built-in self testSUN MICROSYSTEMS INC·Filed 2004·Granted Feb 13, 2007·53 cites·16 claims
- 0487US6874111B1System initialization of microcode-based memory built-in self-testIBM·Filed 2000·Granted Mar 29, 2005·48 cites·15 claims
- 0583US6651201B1Programmable memory built-in self-test combining microcode and finite state machine self-testIBM·Filed 2000·Granted Nov 18, 2003·36 cites·20 claims
- 0682US6806698B2Quantifying a difference between nodal voltagesSUN MICROSYSTEMS INC·Filed 2002·Granted Oct 19, 2004·28 cites·6 claims
- 0779US7260759B1Method and apparatus for an efficient memory built-in self test architecture for high performance microprocessorsSUN MICROSYSTEMS INC·Filed 2004·Granted Aug 21, 2007·27 cites·16 claims
- 0879US7206979B1Method and apparatus for at-speed diagnostics of embedded memoriesSUN MICROSYSTEMS INC·Filed 2004·Granted Apr 17, 2007·28 cites·15 claims
- 0979US6893154B2Integrated temperature sensorSUN MICROSYSTEMS INC·Filed 2002·Granted May 17, 2005·27 cites·14 claims
- 1075US6937958B2Controller for monitoring temperatureSUN MICROSYSTEMS INC·Filed 2002·Granted Aug 30, 2005·22 cites·28 claims
- 1171US6813201B2Automatic generation and validation of memory test modelsSUN MICROSYSTEMS INC·Filed 2001·Granted Nov 2, 2004·18 cites·28 claims
- 1270US10310015B2Method and apparatus for providing clock signals for a scan chainADVANCED MICRO DEVICES INC·Filed 2013·Granted Jun 4, 2019·2 cites·22 claims
- 1361US6700946B2System and method for automatic generation of an at-speed counterSUN MICROSYSTEMS INC·Filed 2002·Granted Mar 2, 2004·9 cites·22 claims
- 1460US6605988B1Low voltage temperature-independent and temperature-dependent voltage generatorSUN MICROSYSTEMS INC·Filed 2002·Granted Aug 12, 2003·11 cites·12 claims
- 1556US7293199B1Method and apparatus for testing memories with different read/write protocols using the same programmable memory bist controllerSUN MICROSYSTEMS INC·Filed 2004·Granted Nov 6, 2007·12 cites·18 claims
- 1652US6809557B2Increasing power supply noise rejection using linear voltage regulators in an on-chip temperature sensorSUN MICROSYSTEMS INC·Filed 2002·Granted Oct 26, 2004·7 cites·7 claims
- 1746US5691990AHybrid partial scan methodIBM·Filed 1996·Granted Nov 25, 1997·13 cites·13 claims
- 1845US6681350B2Method and apparatus for testing memory cells for data retention faultsCADENCE DESIGN SYSTEMS INC·Filed 2001·Granted Jan 20, 2004·6 cites·11 claims
- 1940US2003158683A1Temperature calibration using on-chip electrical fusesFiled 2002·Application pending·0 cites
- 2038US7032144B2Method and apparatus for testing multi-port memoriesCADENCE DESIGN SYSTEMS INC·Filed 2003·Granted Apr 18, 2006·1 cites·12 claims
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