Inventor · disambiguated record
Yousuke Itagaki
Also filed as: ITAGAKI YOUSUKE
14 granted patents·732 citations·filing 2000–2007
94Inventor score
Top patents by PatentIndex Score
14 records- 0198US8051799B2Object-processing apparatus controlling production of particles in electric field or magnetic fieldRENESAS ELECTRONICS CORP·Filed 2007·Granted Nov 8, 2011·374 cites·20 claims
- 0297US6768324B1Semiconductor device tester which measures information related to a structure of a sample in a depth directionFAB SOLUTIONS INC·Filed 2000·Granted Jul 27, 2004·141 cites·35 claims
- 0395US7385195B2Semiconductor device testerTOPCON CORP·Filed 2005·Granted Jun 10, 2008·25 cites·13 claims
- 0491US6559662B1Semiconductor device tester and semiconductor device test methodFAB SOLUTIONS INC·Filed 2000·Granted May 6, 2003·59 cites·31 claims
- 0586US6946857B2Semiconductor device testerFAB SOLUTIONS INC·Filed 2004·Granted Sep 20, 2005·25 cites·25 claims
- 0686US6614244B2Semiconductor device inspecting apparatusFAB SOLUTIONS INC·Filed 2001·Granted Sep 2, 2003·35 cites·13 claims
- 0783US6850079B2Film thickness measuring apparatus and a method for measuring a thickness of a filmFAB SOLUTIONS INC·Filed 2003·Granted Feb 1, 2005·16 cites·32 claims
- 0882US6975125B2Semiconductor device testerFAB SOLUTIONS INC·Filed 2004·Granted Dec 13, 2005·19 cites·42 claims
- 0976US7321805B2Production managing system of semiconductor deviceFAB SOLUTIONS INC·Filed 2004·Granted Jan 22, 2008·14 cites·38 claims
- 1074US7974067B2Plasma processing apparatus and method of suppressing abnormal discharge thereinRENESAS ELECTRONICS CORP·Filed 2006·Granted Jul 5, 2011·5 cites·12 claims
- 1169US6711453B2Production managing system of semiconductor deviceFAB SOLUTIONS INC·Filed 2002·Granted Mar 23, 2004·10 cites·17 claims
- 1260US6842663B2Production managing system of semiconductor deviceFAB SOLUTIONS INC·Filed 2004·Granted Jan 11, 2005·5 cites·11 claims
- 1350US6837936B2Semiconductor manufacturing deviceFAB SOLUTIONS INC·Filed 2002·Granted Jan 4, 2005·2 cites·28 claims
- 1445US7002361B2Film thickness measuring apparatus and a method for measuring a thickness of a filmFAB SOLUTIONS INC·Filed 2004·Granted Feb 21, 2006·2 cites·22 claims
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