Inventor · disambiguated record
Michael Sheperek
Also filed as: SHEPEREK MICHAEL · SHEPEREK MICHAEL W
105 granted patents·8 pending applications·275 citations·filing 2003–2025
99Inventor score
Top patents by PatentIndex Score
113 records- 0199US11340813B1Reliability scan assisted voltage bin selectionMICRON TECHNOLOGY INC·Filed 2020·Granted May 24, 2022·11 cites·20 claims
- 0299US11263134B1Block family combination and voltage bin selectionMICRON TECHNOLOGY INC·Filed 2020·Granted Mar 1, 2022·13 cites·20 claims
- 0398US11217320B1Bin placement according to program-erase cyclesMICRON TECHNOLOGY INC·Filed 2020·Granted Jan 4, 2022·17 cites·20 claims
- 0498US11211128B1Performing threshold voltage offset bin selection by package for memory devicesMICRON TECHNOLOGY INC·Filed 2020·Granted Dec 28, 2021·8 cites·20 claims
- 0598US11177006B2Memory system with dynamic calibration using a trim management mechanismMICRON TECHNOLOGY INC·Filed 2020·Granted Nov 16, 2021·7 cites·20 claims
- 0697US11416173B2Memory system with dynamic calibration using a variable adjustment mechanismMICRON TECHNOLOGY INC·Filed 2020·Granted Aug 16, 2022·5 cites·20 claims
- 0797US11404139B2Smart sampling for block family scanMICRON TECHNOLOGY INC·Filed 2020·Granted Aug 2, 2022·6 cites·20 claims
- 0896US11886726B2Block family-based error avoidance for memory devicesMICRON TECHNOLOGY INC·Filed 2021·Granted Jan 30, 2024·3 cites·20 claims
- 0996US11573720B2Open block family duration limited by time and temperatureMICRON TECHNOLOGY INC·Filed 2020·Granted Feb 7, 2023·5 cites·20 claims
- 1096US11443830B1Error avoidance based on voltage distribution parameters of block familiesMICRON TECHNOLOGY INC·Filed 2021·Granted Sep 13, 2022·4 cites·20 claims
- 1196US11270772B1Voltage offset bin selection by die group for memory devicesMICRON TECHNOLOGY INC·Filed 2020·Granted Mar 8, 2022·5 cites·20 claims
- 1296US10566063B2Memory system with dynamic calibration using a trim management mechanismMICRON TECHNOLOGY INC·Filed 2018·Granted Feb 18, 2020·17 cites·20 claims
- 1395US11842061B2Open block family duration limited by temperature variationMICRON TECHNOLOGY INC·Filed 2020·Granted Dec 12, 2023·3 cites·18 claims
- 1495US11429504B2Closing block family based on soft and hard closure criteriaMICRON TECHNOLOGY INC·Filed 2020·Granted Aug 30, 2022·3 cites·18 claims
- 1595US11301382B2Write data for bin resynchronization after power lossMICRON TECHNOLOGY INC·Filed 2020·Granted Apr 12, 2022·4 cites·20 claims
- 1695US7023647B2Fly height control for a read/write head in a hard disk driveTEXAS INSTRUMENTS INC·Filed 2003·Granted Apr 4, 2006·54 cites·26 claims
- 1794US12040026B2Adjustment of program verify targets corresponding to a last programming distribution and a programming distribution adjacent to an initial programming distributionMICRON TECHNOLOGY INC·Filed 2021·Granted Jul 16, 2024·2 cites·20 claims
- 1893US11231863B2Block family-based error avoidance for memory devicesMICRON TECHNOLOGY INC·Filed 2020·Granted Jan 25, 2022·3 cites·16 claims
- 1992US10748625B1Dynamic programing of valley margins of a memory cellMICRON TECHNOLOGY INC·Filed 2019·Granted Aug 18, 2020·9 cites·20 claims
- 2090US11423989B2Generating embedded data in memory cells in a memory sub-systemMICRON TECHNOLOGY INC·Filed 2020·Granted Aug 23, 2022·2 cites·20 claims
- 2190US10664194B2Memory system with dynamic calibration using a variable adjustment mechanismMICRON TECHNOLOGY INC·Filed 2018·Granted May 26, 2020·7 cites·24 claims
- 2290US10540228B2Providing data of a memory system based on an adjustable error rateMICRON TECHNOLOGY INC·Filed 2018·Granted Jan 21, 2020·5 cites·20 claims
- 2389US9257145B1Disk drive measuring down-track spacing of read sensorsWESTERN DIGITAL TECH INC·Filed 2014·Granted Feb 9, 2016·17 cites·18 claims
- 2489US7097110B2Temperature compensation systems and methods for use with read/write heads in magnetic storage devicesTEXAS INSTRUMENTS INC·Filed 2003·Granted Aug 29, 2006·44 cites·24 claims
- 2587US11404124B2Voltage bin boundary calibration at memory device power upMICRON TECHNOLOGY INC·Filed 2020·Granted Aug 2, 2022·2 cites·20 claims
- 2687US11200956B2Read level calibration in memory devices using embedded servo cellsMICRON TECHNOLOGY INC·Filed 2020·Granted Dec 14, 2021·2 cites·17 claims
- 2787US2025362823A1Open block family duration limited by temperature variationMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 2886US10629278B2First-pass dynamic program targeting (DPT)MICRON TECHNOLOGY INC·Filed 2018·Granted Apr 21, 2020·5 cites·20 claims
- 2986US2025355777A1Closing block family based on soft and hard closure criteriaMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 3085US10936246B2Dynamic background scan optimization in a memory sub-systemMICRON TECHNOLOGY INC·Filed 2018·Granted Mar 2, 2021·3 cites·19 claims
- 3182US12307111B2Block family-based error avoidance for memory devicesMICRON TECHNOLOGY INC·Filed 2023·Granted May 20, 2025·0 cites·20 claims
- 3282US11119848B2Logic based read sample offset in a memory sub systemMICRON TECHNOLOGY INC·Filed 2019·Granted Sep 14, 2021·2 cites·21 claims
- 3382US2025285698A1Data integrity checks based on voltage distribution metricsMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 3481US12424288B2Adjustment of program verify targets corresponding to a last programming distribution and a programming distribution adjacent to an initial programming distributionMICRON TECHNOLOGY INC·Filed 2024·Granted Sep 23, 2025·0 cites·20 claims
- 3581US12417158B2Closing block family based on soft and hard closure criteriaMICRON TECHNOLOGY INC·Filed 2024·Granted Sep 16, 2025·0 cites·20 claims
- 3681US11726689B2Time-based combining for block families of a memory deviceMICRON TECHNOLOGY INC·Filed 2020·Granted Aug 15, 2023·1 cites·18 claims
- 3781US2025246252A1Adjustment of program verify targets corresponding to a last programming distribution and a programming distribution adjacent to an initial programming distributionMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 3879US12482530B2Tracking and refreshing state metrics in memory sub-systemsMICRON TECHNOLOGY INC·Filed 2024·Granted Nov 25, 2025·0 cites·20 claims
- 3979US12423013B2Open block family duration limited by temperature variationMICRON TECHNOLOGY INC·Filed 2023·Granted Sep 23, 2025·0 cites·20 claims
- 4079US11545227B2Threshold voltage offset bin selection based on die family in memory devicesMICRON TECHNOLOGY INC·Filed 2020·Granted Jan 3, 2023·1 cites·18 claims
- 4178US2025244898A1Open block family duration limited by time and temperatureMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 4278US2025181259A1Block family-based error avoidance for memory devicesMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 4376US12334166B2Data integrity checks based on voltage distribution metricsMICRON TECHNOLOGY INC·Filed 2023·Granted Jun 17, 2025·0 cites·17 claims
- 4476US12293099B2Open block family duration limited by time and temperatureMICRON TECHNOLOGY INC·Filed 2023·Granted May 6, 2025·0 cites·20 claims
- 4575US11941277B2Combination scan management for block families of a memory deviceMICRON TECHNOLOGY INC·Filed 2023·Granted Mar 26, 2024·0 cites·20 claims
- 4675US11733929B2Memory system with dynamic calibration using a variable adjustment mechanismMICRON TECHNOLOGY INC·Filed 2022·Granted Aug 22, 2023·0 cites·20 claims
- 4774US11955194B2Tracking and refreshing state metrics in memory sub-systemsMICRON TECHNOLOGY INC·Filed 2023·Granted Apr 9, 2024·0 cites·20 claims
- 4874US11908536B2First-pass continuous read level calibrationMICRON TECHNOLOGY INC·Filed 2022·Granted Feb 20, 2024·0 cites·20 claims
- 4974US11714580B2Dynamic background scan optimization in a memory sub-systemMICRON TECHNOLOGY INC·Filed 2022·Granted Aug 1, 2023·0 cites·16 claims
- 5073US11361825B2Dynamic program erase targeting with bit error rateMICRON TECHNOLOGY INC·Filed 2019·Granted Jun 14, 2022·2 cites·20 claims
Showing the top 50 of 113 patent records by PatentIndex Score.
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