Inventor · disambiguated record

Jae Mok Yi

Also filed as: YI JAE MOK

2 granted patents·2 citations·filing 2006–2006

35Inventor score

Technology areasG01N

Files withPOSTECH FOUNDATION2

Top patents by PatentIndex Score

2 records

0161US7620149B2Characterization of three-dimensional distribution of defects by X-ray topographyPOSTECH FOUNDATION·Filed 2006·Granted Nov 17, 2009·2 cites·7 claims
0242US7903785B2Method of bright-field imaging using X-raysPOSTECH FOUNDATION·Filed 2006·Granted Mar 8, 2011·0 cites·14 claims

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