Inventor · disambiguated record
John Debauche
Also filed as: DEBAUCHE JOHN
3 granted patents·2 citations·filing 2014–2018
51Inventor score
Files withJOHNSTECH INT CORP3
Top patents by PatentIndex Score
3 records- 0160US9696347B2Testing apparatus and method for microcircuit and wafer level IC testingJOHNSTECH INT CORP·Filed 2014·Granted Jul 4, 2017·2 cites·13 claims
- 0256US10928423B2Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin ringsJOHNSTECH INT CORP·Filed 2018·Granted Feb 23, 2021·0 cites·24 claims
- 0351US10067164B2Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin ringsJOHNSTECH INT CORP·Filed 2016·Granted Sep 4, 2018·0 cites·16 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →