Inventor · disambiguated record
Aron Theil
Also filed as: THEIL ARON
3 granted patents·10 citations·filing 2009–2017
62Inventor score
Top patents by PatentIndex Score
3 records- 0186US10451669B2Evaluating a gate-source leakage current in a transistor deviceINFINEON TECHNOLOGIES AG·Filed 2017·Granted Oct 22, 2019·4 cites·18 claims
- 0266US9488674B2Testing device and a circuit arrangementINFINEON TECHNOLOGIES AG·Filed 2014·Granted Nov 8, 2016·2 cites·20 claims
- 0355US8098058B2Circuit arrangement comprising a load transistor and a measuring transistorTHEIL ARON·Filed 2009·Granted Jan 17, 2012·4 cites·20 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →