Inventor · disambiguated record
Klaus-Dieter Hilliges
Also filed as: HILLIGES KLAUS D · HILLIGES KLAUS-DIETER
15 granted patents·6 pending applications·158 citations·filing 2001–2024
92Inventor score
Files withADVANTEST CORP8VERIGY PTE LTD SINGAPORE5AGILENT TECHNOLOGIES INC2KHOCHE A JAY2HILLIGES KLAUS-DIETER1
Top patents by PatentIndex Score
21 records- 0193US7590903B2Re-configurable architecture for automated test equipmentVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Sep 15, 2009·28 cites·17 claims
- 0289US7131046B2System and method for testing circuitry using an externally generated signatureVERIGY IPCO·Filed 2002·Granted Oct 31, 2006·42 cites·27 claims
- 0387US7279919B2Systems and methods of allocating device testing resources to sites of a probe cardVERIGY PTE LTD SINGAPORE·Filed 2005·Granted Oct 9, 2007·16 cites·28 claims
- 0485US7712000B2ATE architecture and method for DFT oriented testingVERIGY PTE LTD SINGAPORE·Filed 2006·Granted May 4, 2010·14 cites·14 claims
- 0581US11385285B2Automated test equipment using an on-chip-system test controllerADVANTEST CORP·Filed 2020·Granted Jul 12, 2022·1 cites·29 claims
- 0677US7571363B2Parametric measurement of high-speed I/O systemsAGILENT TECHNOLOGIES INC·Filed 2006·Granted Aug 4, 2009·10 cites·42 claims
- 0772US9317351B2System, methods and apparatus using virtual appliances in a semiconductor test environmentHILLIGES KLAUS-DIETER·Filed 2010·Granted Apr 19, 2016·5 cites·24 claims
- 0871US11913990B2Automated test equipment for testing one or more devices under test, method for automated testing of one or more devices under test, and computer program for handling command errorsADVANTEST CORP·Filed 2020·Granted Feb 27, 2024·0 cites·23 claims
- 0970US11415628B2Automated test equipment for testing one or more devices under test, method for automated testing of one or more devices under test, and computer program using a buffer memoryADVANTEST CORP·Filed 2020·Granted Aug 16, 2022·0 cites·23 claims
- 1070US6966018B2Integrated circuit tester with multi-port testing functionalityAGILENT TECHNOLOGIES INC·Filed 2001·Granted Nov 15, 2005·16 cites·13 claims
- 1165US7386777B2Systems and methods for processing automatically generated test patternsVERIGY PTE LTD SINGAPORE·Filed 2004·Granted Jun 10, 2008·11 cites·25 claims
- 1261US7184469B2Systems and methods for injection of test jitter in data bit-streamsVERIGY PTE LTD·Filed 2003·Granted Feb 27, 2007·12 cites·37 claims
- 1360US7797599B2Diagnostic information capture from logic devices with built-in self testVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Sep 14, 2010·3 cites·22 claims
- 1452US2024369615A1Automated test equipment, device under test, test setup methods using an acknowledge signalingADVANTEST CORP·Filed 2024·Application pending·0 cites
- 1552US2024369616A1Automated test equipment, device under test, test setup methods using a trigger lineADVANTEST CORP·Filed 2024·Application pending·0 cites
- 1652US2024369617A1Automated test equipment, device under test, test setup methods using a measurement requestADVANTEST CORP·Filed 2024·Application pending·0 cites
- 1749US12467969B2Automated test equipment and method using device specific dataADVANTEST CORP·Filed 2022·Granted Nov 11, 2025·0 cites·23 claims
- 1848US10025648B2System, methods and apparatus using virtual appliances in a semiconductor test environmentADVANTEST CORP·Filed 2015·Granted Jul 17, 2018·0 cites·20 claims
- 1934US2008077835A1Automatic Test Equipment Receiving Diagnostic Information from Devices with Built-in Self TestKHOCHE A JAY·Filed 2006·Application pending·0 cites
- 2034US2008077836A1Diagnostic Information Capture from Memory Devices with Built-in Self TestKHOCHE A JAY·Filed 2006·Application pending·0 cites
- 2134US2008077834A1Deterministic Diagnostic Information Capture from Memory Devices with Built-in Self TestKHOCHE AJAY·Filed 2006·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →