Inventor · disambiguated record
Tomokazu Yamashita
Also filed as: YAMASHITA TOMOKAZU
11 granted patents·4 pending applications·165 citations·filing 2001–2021
88Inventor score
Top patents by PatentIndex Score
15 records- 0196US7940296B2Image capturing unit for endoscopeHOYA CORP·Filed 2006·Granted May 10, 2011·66 cites·14 claims
- 0287US7491167B2Image capturing unit for endoscopeHOYA CORP·Filed 2006·Granted Feb 17, 2009·13 cites·3 claims
- 0385US6947090B2Microminiature image pickup deviceTEXAS INSTRUMENTS INC·Filed 2001·Granted Sep 20, 2005·60 cites·17 claims
- 0481US8177871B2Vitrified bonded grindstoneSOMA SHINJI·Filed 2009·Granted May 15, 2012·9 cites·20 claims
- 0577US9345395B2Imaging module and endoscope deviceOLYMPUS CORP·Filed 2015·Granted May 24, 2016·4 cites·5 claims
- 0672US7628752B2Image capturing unit for electronic endoscopeHOYA CORP·Filed 2006·Granted Dec 8, 2009·11 cites·2 claims
- 0753US11957306B2Distal end frame of endoscope, distal end unit, and endoscopeOLYMPUS CORP·Filed 2021·Granted Apr 16, 2024·0 cites·10 claims
- 0847US7070735B2Aluminum alloy material for forging and continuous casting process thereforTOYAMA ALLOY CO LTD·Filed 2003·Granted Jul 4, 2006·2 cites·4 claims
- 0946US9149912B2Cubic boron nitride grinding wheelSOMA SHINJI·Filed 2011·Granted Oct 6, 2015·0 cites·15 claims
- 1045US2007007360A1Image capturing element package for electronic endoscopePENTAX CORP·Filed 2006·Application pending·0 cites
- 1145US2007008407A1Image capturing device for electronic endoscopePENTAX CORP·Filed 2006·Application pending·0 cites
- 1242US10631719B2EndoscopeOLYMPUS CORP·Filed 2017·Granted Apr 28, 2020·0 cites·4 claims
- 1342US8678719B2Cutting tip, method of forming cutting tip, and method of manufacturing cutting tipONO NAOTO·Filed 2008·Granted Mar 25, 2014·0 cites·13 claims
- 1440US2017255001A1Imaging unit, endoscope, and method of manufacturing imaging unitOLYMPUS CORP·Filed 2017·Application pending·0 cites
- 1538US2017360284A1Endoscope deviceOLYMPUS CORP·Filed 2017·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →