Inventor · disambiguated record
Yutaka Maruo
Also filed as: MARUO YUTAKA
16 granted patents·1 pending application·167 citations·filing 1989–2007
93Inventor score
Files withSEIKO EPSON CORP17
Top patents by PatentIndex Score
17 records- 0190US6709922B2Method of manufacturing semiconductor integrated circuit device including nonvolatile semiconductor memory devicesSEIKO EPSON CORP·Filed 2002·Granted Mar 23, 2004·47 cites·15 claims
- 0282US7126175B2Semiconductor device including light shieled structuresSEIKO EPSON CORP·Filed 2005·Granted Oct 24, 2006·12 cites·9 claims
- 0378US7508019B2Semiconductor deviceSEIKO EPSON CORP·Filed 2007·Granted Mar 24, 2009·6 cites·37 claims
- 0477US7304337B2Semiconductor deviceSEIKO EPSON CORP·Filed 2005·Granted Dec 4, 2007·6 cites·3 claims
- 0576US6946638B2Solid-state imaging device and method of driving the sameSEIKO EPSON CORP·Filed 2004·Granted Sep 20, 2005·25 cites·10 claims
- 0672US7473962B2Semiconductor device having nonvolatile memory device with improved charge holding propertySEIKO EPSON CORP·Filed 2006·Granted Jan 6, 2009·4 cites·10 claims
- 0770US7253462B2Semiconductor deviceSEIKO EPSON CORP·Filed 2005·Granted Aug 7, 2007·3 cites·10 claims
- 0869US6809385B2Semiconductor integrated circuit device including nonvolatile semiconductor memory devices having control gates connected to common contact sectionSEIKO EPSON CORP·Filed 2002·Granted Oct 26, 2004·12 cites·30 claims
- 0965US7482647B2Semiconductor deviceSEIKO EPSON CORP·Filed 2007·Granted Jan 27, 2009·2 cites·35 claims
- 1063US7285764B2Solid state imaging device and method of driving the sameSEIKO EPSON CORP·Filed 2004·Granted Oct 23, 2007·11 cites·10 claims
- 1161US6828209B1Methods for manufacturing a semiconductor device including a trench isolation regionSEIKO EPSON CORP·Filed 2000·Granted Dec 7, 2004·11 cites·23 claims
- 1260US7626225B2Semiconductor device including nonvolatile memory having a floating gate electrodeSEIKO EPSON CORP·Filed 2006·Granted Dec 1, 2009·2 cites·11 claims
- 1359US5181090AHigh voltage cmos devicesSEIKO EPSON CORP·Filed 1989·Granted Jan 19, 1993·19 cites·9 claims
- 1451US7612396B2Semiconductor deviceSEIKO EPSON CORP·Filed 2007·Granted Nov 3, 2009·0 cites·14 claims
- 1549US7667249B2Semiconductor deviceSEIKO EPSON CORP·Filed 2007·Granted Feb 23, 2010·0 cites·6 claims
- 1639US5407839AMOS manufacturing process having reduced gate insulator defectsSEIKO EPSON CORP·Filed 1992·Granted Apr 18, 1995·7 cites·19 claims
- 1739US2006273373A1Semiconductor deviceSEIKO EPSON CORP·Filed 2006·Application pending·0 cites
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