Inventor · disambiguated record
Kent Jaeger
Also filed as: JAEGER KENT
12 granted patents·1 pending application·15 citations·filing 2008–2023
84Inventor score
Top patents by PatentIndex Score
13 records- 0183US10404212B1Programmable driver for frequency mixerFUTUREWEI TECHNOLOGIES INC·Filed 2018·Granted Sep 3, 2019·3 cites·20 claims
- 0282US9166571B2Low power high speed quadrature generatorFUTUREWEI TECHNOLOGIES INC·Filed 2013·Granted Oct 20, 2015·6 cites·16 claims
- 0378US8928369B1Low power local oscillator quadrature generatorFUTUREWEI TECHNOLOGIES INC·Filed 2013·Granted Jan 6, 2015·5 cites·20 claims
- 0468US11595003B2Programmable driver for frequency mixerHUAWEI TECH CO LTD·Filed 2020·Granted Feb 28, 2023·0 cites·20 claims
- 0565US11569393B2Apparatus and method for a low loss coupling capacitorFUTUREWEI TECHNOLOGIES INC·Filed 2020·Granted Jan 31, 2023·0 cites·16 claims
- 0662US12445116B2Combined process and temperature adjustable voltage regulationHUAWEI TECH CO LTD·Filed 2023·Granted Oct 14, 2025·0 cites·18 claims
- 0757US10586878B2Apparatus and method for a low loss coupling capacitorFUTUREWEI TECHNOLOGIES INC·Filed 2017·Granted Mar 10, 2020·0 cites·17 claims
- 0851US9837555B2Apparatus and method for a low loss coupling capacitorFUTUREWEI TECHNOLOGIES INC·Filed 2015·Granted Dec 5, 2017·0 cites·26 claims
- 0951US9768165B2High isolation switchFUTUREWEI TECHNOLOGIES INC·Filed 2016·Granted Sep 19, 2017·0 cites·20 claims
- 1049US9449969B1Device and method for a high isolation switchFUTUREWEI TECHNOLOGIES INC·Filed 2015·Granted Sep 20, 2016·0 cites·21 claims
- 1145US7733181B2Amplifier circuit having dynamically biased configurationFREESCALE SEMICONDUCTOR INC·Filed 2008·Granted Jun 8, 2010·1 cites·20 claims
- 1243US9647622B1System and method for offset voltage calibrationFUTUREWEI TECHNOLOGIES INC·Filed 2015·Granted May 9, 2017·0 cites·20 claims
- 1337US2014361814A1High Speed LatchFUTUREWEI TECHNOLOGIES INC·Filed 2013·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →