Inventor · disambiguated record
Assaf Asbag
Also filed as: ASBAG ASSAF
12 granted patents·1 pending application·27 citations·filing 2017–2020
86Inventor score
Top patents by PatentIndex Score
13 records- 0187US10832092B2Method of generating a training set usable for examination of a semiconductor specimen and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted Nov 10, 2020·8 cites·11 claims
- 0286US11526979B2Method of defect classification and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Dec 13, 2022·2 cites·20 claims
- 0382US11199506B2Generating a training set usable for examination of a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted Dec 14, 2021·3 cites·16 claims
- 0482US11138507B2System, method and computer program product for classifying a multiplicity of itemsAPPLIED MATERIALS ISRAEL LTD·Filed 2017·Granted Oct 5, 2021·5 cites·20 claims
- 0582US10748271B2Method of defect classification and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Aug 18, 2020·4 cites·20 claims
- 0674US11568531B2Method of deep learning-based examination of a semiconductor specimen and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Jan 31, 2023·1 cites·20 claims
- 0772US10360669B2System, method and computer program product for generating a training set for a classifierAPPLIED MATERIALS ISRAEL LTD·Filed 2017·Granted Jul 23, 2019·2 cites·20 claims
- 0870US11037286B2Method of classifying defects in a semiconductor specimen and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2017·Granted Jun 15, 2021·2 cites·20 claims
- 0956US10803575B2System, method and computer program product for generating a training set for a classifierAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted Oct 13, 2020·0 cites·20 claims
- 1043US10921334B2System, method and computer program product for classifying defectsAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Feb 16, 2021·0 cites·12 claims
- 1142US2020210809A1System and method for outlier detection using a cascade of neural networksPLAYTIKA LTD·Filed 2018·Application pending·0 cites
- 1239US11321633B2Method of classifying defects in a specimen semiconductor examination and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted May 3, 2022·0 cites·19 claims
- 1338US11151706B2Method of classifying defects in a semiconductor specimen and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted Oct 19, 2021·0 cites·9 claims
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