Inventor · disambiguated record
Kazuhiro Miyakawa
Also filed as: MIYAKAWA KAZUHIRO
7 granted patents·5 pending applications·55 citations·filing 1999–2009
82Inventor score
Top patents by PatentIndex Score
12 records- 0167US7477373B2Surface inspection method and surface inspection deviceTOPCON CORP·Filed 2007·Granted Jan 13, 2009·2 cites·8 claims
- 0267US7417732B2Particle monitoring apparatus and vacuum processing apparatusTOPCON CORP·Filed 2005·Granted Aug 26, 2008·2 cites·10 claims
- 0360US7348585B2Surface inspection apparatusTOPCON CORP·Filed 2005·Granted Mar 25, 2008·4 cites·18 claims
- 0459US7245366B2Surface inspection method and surface inspection apparatusTOPCON CORP·Filed 2004·Granted Jul 17, 2007·3 cites·12 claims
- 0554US7154597B2Method for inspecting surface and apparatus for inspecting itTOPCON CORP·Filed 2004·Granted Dec 26, 2006·5 cites·9 claims
- 0651US7227649B2Surface inspection apparatusTOPCON CORP·Filed 2005·Granted Jun 5, 2007·2 cites·12 claims
- 0746US2012120485A1Interference microscope and measuring apparatusOOTOMO FUMIO·Filed 2009·Application pending·0 cites
- 0844US2004169853A1Surface inspection apparatusFiled 2004·Application pending·0 cites
- 0943US6120444ANoncontact tonometer capable of measuring intraocular tension by optically detecting deformation of cornea caused by air currentTOPCON CORP·Filed 1999·Granted Sep 19, 2000·37 cites·7 claims
- 1042US2008112066A1Camera module capable of fixing lens held in lens barrel after the lens is adjusted in optical axis directionALPS ELECTRIC CO LTD·Filed 2007·Application pending·0 cites
- 1139US2004095572A1Laser light source device and surface inspection apparatus using itTOPCON CORP·Filed 2003·Application pending·0 cites
- 1237US2005199582A1Method for forming fine gratingALPS ELECTRIC CO LTD·Filed 2005·Application pending·0 cites
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