Inventor · disambiguated record
Sicco Ian Schets
Also filed as: SCHETS SICCO · SCHETS SICCO I · SCHETS SICCO IAN
12 granted patents·209 citations·filing 2003–2019
93Inventor score
Files withASML NETHERLANDS BV8DUNBAR ALLAN1EZONO AG1VAN BILSEN FRANCISCUS BERNARDUS MARIA1ZEITNER UWE D1
Top patents by PatentIndex Score
12 records- 0196US7880880B2Alignment systems and methods for lithographic systemsASML NETHERLANDS BV·Filed 2005·Granted Feb 1, 2011·24 cites·15 claims
- 0295US7329888B2Alignment systems and methods for lithographic systemsASML NETHERLANDS BV·Filed 2005·Granted Feb 12, 2008·18 cites·28 claims
- 0393US7297971B2Alignment systems and methods for lithographic systemsASML NETHERLANDS BV·Filed 2005·Granted Nov 20, 2007·12 cites·3 claims
- 0492US8139217B2Alignment systems and methods for lithographic systemsVAN BILSEN FRANCISCUS BERNARDUS MARIA·Filed 2010·Granted Mar 20, 2012·12 cites·18 claims
- 0590US8240211B2Ultrasonic probe and method for the optical detection of ultrasonic wavesZEITNER UWE D·Filed 2007·Granted Aug 14, 2012·64 cites·37 claims
- 0690US7439531B2Alignment systems and methods for lithographic systemsASML NETHERLANDS BV·Filed 2006·Granted Oct 21, 2008·7 cites·32 claims
- 0790US7332732B2Alignment systems and methods for lithographic systemsASML NETHERLANDS BV·Filed 2003·Granted Feb 19, 2008·22 cites·143 claims
- 0886US11311269B2Ultrasound imaging system and method for providing assistance in an ultrasound imaging systemEZONO AG·Filed 2019·Granted Apr 26, 2022·13 cites·18 claims
- 0979US9155517B2Opto-electrical ultrasound sensor and systemDUNBAR ALLAN·Filed 2008·Granted Oct 13, 2015·21 cites·19 claims
- 1070US7565219B2Lithographic apparatus, method of determining a model parameter, device manufacturing method, and device manufactured therebyASML NETHERLANDS BV·Filed 2003·Granted Jul 21, 2009·9 cites·9 claims
- 1154US7558643B2Lithographic apparatus, method of determining a model parameter, device manufacturing method, and device manufactured therebyASML NETHERLANDS BV·Filed 2004·Granted Jul 7, 2009·3 cites·25 claims
- 1250US7288779B2Method for position determination, method for overlay optimization, and lithographic projection apparatusASML NETHERLANDS BV·Filed 2003·Granted Oct 30, 2007·4 cites·31 claims
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