Inventor · disambiguated record
Chun-Ting Chiang
Also filed as: CHIANG CHUN · CHIANG CHUN-TING
13 granted patents·1 pending application·39 citations·filing 2011–2023
87Inventor score
Top patents by PatentIndex Score
14 records- 0196US10062764B1Semiconductor device having void between gate electrode and sidewall spacer and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2017·Granted Aug 28, 2018·19 cites·10 claims
- 0289US8980151B2Method for compression molding a dual core for a golf ballCHOU CHIEN-HSIN·Filed 2011·Granted Mar 17, 2015·10 cites·12 claims
- 0388US10170573B1Semiconductor device and fabrication method thereofUNITED MICROELECTRONICS CORP·Filed 2017·Granted Jan 1, 2019·6 cites·10 claims
- 0483US10903205B2Semiconductor device of electrostatic discharge protectionUNITED MICROELECTRONICS CORP·Filed 2019·Granted Jan 26, 2021·3 cites·18 claims
- 0573US11239082B2Method for fabricating semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2019·Granted Feb 1, 2022·1 cites·8 claims
- 0663US11257807B2Semiconductor device of electrostatic discharge protectionUNITED MICROELECTRONICS CORP·Filed 2020·Granted Feb 22, 2022·0 cites·8 claims
- 0758US10468493B2Method for manufacturing gate stack structureUNITED MICROELECTRONICS CORP·Filed 2018·Granted Nov 5, 2019·0 cites·9 claims
- 0856US2025098238A1Semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2023·Application pending·0 cites
- 0955US10388749B2Manufacturing method of semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2018·Granted Aug 20, 2019·0 cites·8 claims
- 1054US10186594B2Semiconductor device having metal gateUNITED MICROELECTRONICS CORP·Filed 2017·Granted Jan 22, 2019·0 cites·6 claims
- 1152US10366896B2Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2017·Granted Jul 30, 2019·0 cites·7 claims
- 1245US11004840B2Electrostatic discharge protection structureUNITED MICROELECTRONICS CORP·Filed 2018·Granted May 11, 2021·0 cites·21 claims
- 1344US10522530B2Electrostatic discharge shielding semiconductor device and electrostatic discharge testing method thereofUNITED MICROELECTRONICS CORP·Filed 2018·Granted Dec 31, 2019·0 cites·8 claims
- 1442US10978442B2Electrostatic discharge (ESD) protection device and forming method thereofUNITED MICROELECTRONICS CORP·Filed 2019·Granted Apr 13, 2021·0 cites·18 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →