Inventor · disambiguated record
Soichiro Matsunaga
Also filed as: MATSUNAGA SOICHIRO
8 granted patents·3 pending applications·2 citations·filing 2014–2024
72Inventor score
Technology areasH01J
Files withHITACHI HIGH TECH CORP11
Top patents by PatentIndex Score
11 records- 0181US10903037B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Jan 26, 2021·2 cites·13 claims
- 0262US2025022676A1Electron beam device including schottky emitter and method of operating schottky emitterHITACHI HIGH TECH CORP·Filed 2024·Application pending·0 cites
- 0361US12456597B2Energy filter, and energy analyzer and charged particle beam device provided with sameHITACHI HIGH TECH CORP·Filed 2020·Granted Oct 28, 2025·0 cites·19 claims
- 0458US12394585B2Electron source, electron gun, and charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Aug 19, 2025·0 cites·17 claims
- 0551US11894211B2Electron beam apparatus and method for controlling electron beam apparatusHITACHI HIGH TECH CORP·Filed 2019·Granted Feb 6, 2024·0 cites·12 claims
- 0651US11322329B2Electron source, method for manufacturing the same, and electron beam device using the sameHITACHI HIGH TECH CORP·Filed 2018·Granted May 3, 2022·0 cites·11 claims
- 0751US11227740B2Electron gun and electron beam application deviceHITACHI HIGH TECH CORP·Filed 2017·Granted Jan 18, 2022·0 cites·9 claims
- 0851US9006654B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2014·Granted Apr 14, 2015·0 cites·15 claims
- 0948US11508544B2Thermoelectric field emission electron source and electron beam application deviceHITACHI HIGH TECH CORP·Filed 2018·Granted Nov 22, 2022·0 cites·21 claims
- 1041US2022199349A1Electron source and charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2019·Application pending·0 cites
- 1136US2019198284A1Electron source and electron beam irradiation deviceHITACHI HIGH TECH CORP·Filed 2016·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →