Inventor · disambiguated record
Jukiya Fukushi
Also filed as: FUKUSHI JUKIYA
6 granted patents·8 citations·filing 2020–2022
73Inventor score
Files withNIHON MICRONICS KK6
Top patents by PatentIndex Score
6 records- 0190US11971431B2Optical probe, optical probe array, optical probe card, and method of manufacturing optical probeNIHON MICRONICS KK·Filed 2021·Granted Apr 30, 2024·2 cites·9 claims
- 0290US11971296B2Measurement system and measurement methodNIHON MICRONICS KK·Filed 2021·Granted Apr 30, 2024·2 cites·15 claims
- 0388US11624679B2Optical probe, optical probe array, test system and test methodNIHON MICRONICS KK·Filed 2020·Granted Apr 11, 2023·2 cites·9 claims
- 0486US11860190B2Probe unit with a free length cantilever contactor and pedestalNIHON MICRONICS KK·Filed 2022·Granted Jan 2, 2024·1 cites·12 claims
- 0582US12031921B2Measurement systemNIHON MICRONICS KK·Filed 2020·Granted Jul 9, 2024·1 cites·4 claims
- 0652US12360155B2Optical probe, probe card, measuring system, and measuring methodNIHON MICRONICS KK·Filed 2020·Granted Jul 15, 2025·0 cites·14 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →