Inventor · disambiguated record
Chung-Koo Yoon
Also filed as: YOON CHUNG-KOO
5 granted patents·53 citations·filing 1998–2004
80Inventor score
Files withSAMSUNG ELECTRONICS CO LTD5
Top patents by PatentIndex Score
5 records- 0159US6771088B2Method and apparatus for testing semiconductor devices using the back side of a circuit boardSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Aug 3, 2004·6 cites·22 claims
- 0258US7075325B2Method and apparatus for testing semiconductor devices using an actual board-type productSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Jul 11, 2006·9 cites·20 claims
- 0357US6335629B1Test fixture having an opening for exposing the back of a semiconductor chip and testing module comprising the sameSAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Jan 1, 2002·29 cites·22 claims
- 0453US6833721B2Method and apparatus for testing semiconductor devices using an actual board-type productSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Dec 21, 2004·7 cites·22 claims
- 0548US7256594B2Method and apparatus for testing semiconductor devices using the back side of a circuit boardSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Aug 14, 2007·2 cites·7 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →