Inventor · disambiguated record
Hiroyuki Mineo
Also filed as: MINEO HIROYUKI
7 granted patents·3 pending applications·68 citations·filing 2005–2025
82Inventor score
Top patents by PatentIndex Score
10 records- 0187US7458837B2Connector housing block, interface member and electronic device testing apparatusADVANTEST CORP·Filed 2006·Granted Dec 2, 2008·36 cites·14 claims
- 0286US7339385B2Semiconductor test apparatus and interface plateADVANTEST CORP·Filed 2005·Granted Mar 4, 2008·19 cites·3 claims
- 0376US12025654B2Electronic component testing apparatus, sockets, and replacement parts for electronic component testing apparatusADVANTEST CORP·Filed 2023·Granted Jul 2, 2024·0 cites·8 claims
- 0475US2025172612A1Test arrangement for over-the-air testing an angled device under test in a device-under-test socketADVANTEST CORP·Filed 2025·Application pending·0 cites
- 0575US2025172600A1Test arrangement for over-the-air testing an angled device under test that is tilted relative to a surface of a carrier structureADVANTEST CORP·Filed 2025·Application pending·0 cites
- 0675US2025172613A1Test arrangement for over-the-air testing an angled device under test using a carrier structure with an openingADVANTEST CORP·Filed 2025·Application pending·0 cites
- 0768US7405582B2Measurement board for electronic device test apparatusADVANTEST CORP·Filed 2006·Granted Jul 29, 2008·11 cites·2 claims
- 0864US11802904B2Electronic component testing apparatus, sockets, and replacement parts for electronic component testing apparatusADVANTEST CORP·Filed 2020·Granted Oct 31, 2023·0 cites·16 claims
- 0946US7688092B2Measuring board for electronic device test apparatusADVANTEST CORP·Filed 2008·Granted Mar 30, 2010·2 cites·8 claims
- 1032US8314630B2Test section unit, test head and electronic device testing apparatusMURAKAMI TORU·Filed 2010·Granted Nov 20, 2012·0 cites·13 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →