Inventor · disambiguated record
Ki-Suk Chung
Also filed as: CHUNG KI-SUK
3 granted patents·14 citations·filing 2005–2006
65Inventor score
Files withSAMSUNG ELECTRONICS CO LTD3
Top patents by PatentIndex Score
3 records- 0177US7486392B2Method of inspecting for defects and apparatus for performing the methodSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Feb 3, 2009·6 cites·11 claims
- 0273US7385689B2Method and apparatus for inspecting substrate patternSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Jun 10, 2008·5 cites·35 claims
- 0369US7446865B2Method of classifying defectsSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Nov 4, 2008·3 cites·17 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →