Inventor · disambiguated record
Jeffrey S. Mcneil
Also filed as: MCNEIL JEFFREY · MCNEIL JEFFREY S · MCNEIL JR JEFFREY S · MCNEIL JR JEFFREY SCOTT
55 granted patents·21 pending applications·72 citations·filing 1991–2025
97Inventor score
Top patents by PatentIndex Score
76 records- 0196US11177014B1Global-local read calibrationMICRON TECHNOLOGY INC·Filed 2020·Granted Nov 16, 2021·10 cites·20 claims
- 0295US11288160B2Threshold voltage distribution adjustment for bufferMICRON TECHNOLOGY INC·Filed 2020·Granted Mar 29, 2022·4 cites·20 claims
- 0393US10379963B2Methods and apparatus for managing a large-scale environment of copy data management appliancesACTIFIO INC·Filed 2015·Granted Aug 13, 2019·24 cites·15 claims
- 0488US11385819B2Separate partition for buffer and snapshot memoryMICRON TECHNOLOGY INC·Filed 2020·Granted Jul 12, 2022·2 cites·27 claims
- 0588US11360700B2Partitions within snapshot memory for buffer and snapshot memoryMICRON TECHNOLOGY INC·Filed 2020·Granted Jun 14, 2022·2 cites·20 claims
- 0686US12217799B2Parallelized defect detection across multiple sub-blocks in a memory deviceMICRON TECHNOLOGY INC·Filed 2023·Granted Feb 4, 2025·1 cites·20 claims
- 0785US11069408B2Apparatus for discharging control gates after performing an access operation on a memory cellMICRON TECHNOLOGY INC·Filed 2020·Granted Jul 20, 2021·2 cites·20 claims
- 0882US2025306805A1Using duplicate data for improving error correction capabilityMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 0981US2025362815A1Selectively programming retired wordlines of a memory deviceMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 1080US12327048B2Using duplicate data for improving error correction capabilityMICRON TECHNOLOGY INC·Filed 2023·Granted Jun 10, 2025·0 cites·20 claims
- 1180US2025348222A1Validating read level voltage in memory devicesMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 1279US11301346B2Separate trims for buffer and snapshotMICRON TECHNOLOGY INC·Filed 2020·Granted Apr 12, 2022·1 cites·18 claims
- 1378US2025285675A1Sacrificial strings in a memory device to detect read disturbMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 1478US2025292829A1Managing a maximum program voltage level during all levels programming of a memory deviceMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 1577US12340126B2Workload-based scan optimizationMICRON TECHNOLOGY INC·Filed 2024·Granted Jun 24, 2025·0 cites·20 claims
- 1675US12444453B2Volatile data storage in NAND memoryMICRON TECHNOLOGY INC·Filed 2023·Granted Oct 14, 2025·0 cites·20 claims
- 1775US2025053301A1Programming selective word lines during an erase operation in a memory deviceMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 1874US12142343B2Memory devices for multiple read operationsMICRON TECHNOLOGY INC·Filed 2023·Granted Nov 12, 2024·0 cites·13 claims
- 1974US2025029641A1Memory devices for multiple read operationsMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 2074US2024370206A1On-die cross-temperature management for a memory deviceMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 2172US12373109B2Validating read level voltage in memory devicesMICRON TECHNOLOGY INC·Filed 2022·Granted Jul 29, 2025·0 cites·20 claims
- 2272US12131028B2Programming selective word lines during an erase operation in a memory deviceMICRON TECHNOLOGY INC·Filed 2023·Granted Oct 29, 2024·0 cites·20 claims
- 2372US10665300B1Apparatus and methods for discharging control gates after performing an access operation on a memory cellMICRON TECHNOLOGY INC·Filed 2018·Granted May 26, 2020·2 cites·35 claims
- 2471US12026052B2Partitioned memory having error detection capabilityLODESTAR LICENSING GROUP LLC·Filed 2022·Granted Jul 2, 2024·0 cites·20 claims
- 2571US11861233B2Using duplicate data for improving error correction capabilityMICRON TECHNOLOGY INC·Filed 2022·Granted Jan 2, 2024·0 cites·20 claims
- 2671US11775208B2Partitions within snapshot memory for buffer and snapshot memoryMICRON TECHNOLOGY INC·Filed 2022·Granted Oct 3, 2023·0 cites·20 claims
- 2771US2025078932A1Concurrent programming of retired wordline cells with dummy dataMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 2871US2024402922A1Two-tier defect scan managementMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 2971US2025004645A1Copyback clear command for performing a scan and read in a memory deviceMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 3070US12170113B2Concurrent programming of retired wordline cells with dummy dataMICRON TECHNOLOGY INC·Filed 2022·Granted Dec 17, 2024·0 cites·20 claims
- 3170US11663104B2Threshold voltage distribution adjustment for bufferMICRON TECHNOLOGY INC·Filed 2022·Granted May 30, 2023·0 cites·20 claims
- 3270US2024395338A1Read voltage level bin selectionMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 3369US11797216B2Read calibration based on ranges of program/erase cyclesMICRON TECHNOLOGY INC·Filed 2022·Granted Oct 24, 2023·0 cites·11 claims
- 3468US12423002B2Selectively programming retired wordlines of a memory deviceMICRON TECHNOLOGY INC·Filed 2022·Granted Sep 23, 2025·0 cites·17 claims
- 3568US12347485B2Establishing bitline, wordline and boost voltages to manage a maximum program voltage level during all levels programming of a memory deviceMICRON TECHNOLOGY INC·Filed 2023·Granted Jul 1, 2025·0 cites·20 claims
- 3668US12141437B2Program command generation with dummy data generation at a memory deviceMICRON TECHNOLOGY INC·Filed 2022·Granted Nov 12, 2024·0 cites·20 claims
- 3768US11789629B2Separate partition for buffer and snapshot memoryMICRON TECHNOLOGY INC·Filed 2022·Granted Oct 17, 2023·0 cites·18 claims
- 3867US12456502B2Generating semi-soft bit data during corrective read operations in memory devicesMICRON TECHNOLOGY INC·Filed 2023·Granted Oct 28, 2025·0 cites·20 claims
- 3967US12148484B2Memory sub-system scanMICRON TECHNOLOGY INC·Filed 2022·Granted Nov 19, 2024·0 cites·14 claims
- 4067US12105967B2Two-tier defect scan managementMICRON TECHNOLOGY INC·Filed 2022·Granted Oct 1, 2024·0 cites·20 claims
- 4167US11756594B2Memory devices for multiple read operationsMICRON TECHNOLOGY INC·Filed 2021·Granted Sep 12, 2023·0 cites·16 claims
- 4267US11688479B2Read window based on program/erase cyclesMICRON TECHNOLOGY INC·Filed 2021·Granted Jun 27, 2023·0 cites·18 claims
- 4367US2025149093A1All level coarse/fine programming of memory cellsMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 4466US12334142B2Sacrificial strings in a memory device to detect read disturbMICRON TECHNOLOGY INC·Filed 2022·Granted Jun 17, 2025·0 cites·20 claims
- 4566US12067290B2On-die cross-temperature management for a memory deviceMICRON TECHNOLOGY INC·Filed 2022·Granted Aug 20, 2024·0 cites·17 claims
- 4666US11977778B2Workload-based scan optimizationMICRON TECHNOLOGY INC·Filed 2022·Granted May 7, 2024·0 cites·20 claims
- 4766US2025140317A1Parallelized defect detection across multiple sub-blocks in a memory deviceMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 4865US12224012B2All level coarse/fine programming of memory cellsMICRON TECHNOLOGY INC·Filed 2023·Granted Feb 11, 2025·0 cites·20 claims
- 4965US11710523B2Apparatus for discharging control gates after performing a sensing operation on a memory cellMICRON TECHNOLOGY INC·Filed 2021·Granted Jul 25, 2023·0 cites·25 claims
- 5065US2025391477A1Memory configured to program memory cells having multiple different channel voltage levels and methods of their operationMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
Showing the top 50 of 76 patent records by PatentIndex Score.
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