Inventor · disambiguated record
Yan Avniel
Also filed as: AVNIEL YAN
4 granted patents·1 pending application·1 citations·filing 2018–2024
57Inventor score
Files withAPPLIED MATERIALS ISRAEL LTD5
Top patents by PatentIndex Score
5 records- 0164US10636140B2Technique for inspecting semiconductor wafersAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Apr 28, 2020·1 cites·18 claims
- 0263US11301983B2Measuring height difference in patterns on semiconductor wafersAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Apr 12, 2022·0 cites·20 claims
- 0353US10748272B2Measuring height difference in patterns on semiconductor wafersAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Aug 18, 2020·0 cites·20 claims
- 0451US2025225646A1Systems and methods for registration between images informative of one or more semiconductor specimensAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 0534US11995848B2Image generation for examination of a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2021·Granted May 28, 2024·0 cites·19 claims
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