Inventor · disambiguated record
Ishai Schwarzband
Also filed as: SCHWARZBAND ISHAI
24 granted patents·2 pending applications·72 citations·filing 2001–2024
94Inventor score
Top patents by PatentIndex Score
26 records- 0194US9530199B1Technique for measuring overlay between layers of a multilayer structureAPPLIED MATERIALS ISRAEL LTD·Filed 2015·Granted Dec 27, 2016·12 cites·15 claims
- 0292US10354376B2Technique for measuring overlay between layers of a multilayer structureAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Jul 16, 2019·5 cites·20 claims
- 0387US9378923B2Three-dimensional mapping using scanning electron microscope imagesAPPLIED MATERIALS ISRAEL LTD·Filed 2015·Granted Jun 28, 2016·4 cites·20 claims
- 0486US8604427B2Three-dimensional mapping using scanning electron microscope imagesSCHWARZBAND ISHAI·Filed 2012·Granted Dec 10, 2013·8 cites·20 claims
- 0585US9858658B2Defect classification using CAD-based context attributesKAIZERMAN IDAN·Filed 2012·Granted Jan 2, 2018·9 cites·30 claims
- 0685US9595091B2Defect classification using topographical attributesKAIZERMAN IDAN·Filed 2012·Granted Mar 14, 2017·9 cites·26 claims
- 0783US9916652B2Technique for measuring overlay between layers of a multilayer structureAPPLIED MATERIALS ISRAEL LTD·Filed 2016·Granted Mar 13, 2018·2 cites·20 claims
- 0876US11276160B2Determining a critical dimension variation of a patternAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Mar 15, 2022·2 cites·17 claims
- 0976US8946627B2Three-dimensional mapping using scanning electron microscope imagesAPPLIED MATERIALS ISRAEL LTD·Filed 2013·Granted Feb 3, 2015·3 cites·18 claims
- 1070US7310796B2System and method for simulating an aerial imageAPPLIED MATERIALS ISRAEL LTD·Filed 2004·Granted Dec 18, 2007·10 cites·21 claims
- 1169US11756188B2Determining a critical dimension variation of a patternAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Granted Sep 12, 2023·0 cites·14 claims
- 1264US10636140B2Technique for inspecting semiconductor wafersAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Apr 28, 2020·1 cites·18 claims
- 1364US8213024B2Method and system for aerial imaging of a reticleMANGAN SHMUEL·Filed 2007·Granted Jul 3, 2012·2 cites·52 claims
- 1463US11301983B2Measuring height difference in patterns on semiconductor wafersAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Apr 12, 2022·0 cites·20 claims
- 1562US9490101B2System and method for scanning an objectAPPLIED MATERIALS ISRAEL LTD·Filed 2015·Granted Nov 8, 2016·1 cites·11 claims
- 1659US9715724B2Registration of CAD data with SEM imagesAPPLIED MATERIALS ISRAEL LTD·Filed 2014·Granted Jul 25, 2017·2 cites·34 claims
- 1753US10748272B2Measuring height difference in patterns on semiconductor wafersAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Aug 18, 2020·0 cites·20 claims
- 1851US2025225646A1Systems and methods for registration between images informative of one or more semiconductor specimensAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 1950US8098926B2Method and system for evaluating an evaluated pattern of a maskSCHWARZBAND ISHAI·Filed 2008·Granted Jan 17, 2012·2 cites·27 claims
- 2046US10504693B2Evaluating an objectAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Dec 10, 2019·0 cites·15 claims
- 2144US11651509B2Method, system and computer program product for 3D-NAND CDSEM metrologyAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted May 16, 2023·0 cites·11 claims
- 2242US2002080865A1Bidirectional signal repeaterFiled 2001·Application pending·0 cites
- 2341US10103005B2Imaging low electron yield regions with a charged beam imagerAPPLIED MATERIALS ISRAEL LTD·Filed 2015·Granted Oct 16, 2018·0 cites·20 claims
- 2440US10731979B2Method for monitoring nanometric structuresAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Aug 4, 2020·0 cites·19 claims
- 2538US9674536B2Technique for visualizing elements in images by color codingAPPLIED MATERIALS ISRAEL LTD·Filed 2015·Granted Jun 6, 2017·0 cites·20 claims
- 2636US9824852B2CD-SEM technique for wafers fabrication controlAPPLIED MATERIALS ISRAEL LTD·Filed 2015·Granted Nov 21, 2017·0 cites·20 claims
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