Inventor · disambiguated record
Sylvain Petitgrand
Also filed as: PETITGRAND SYLVAIN
3 granted patents·9 pending applications·4 citations·filing 2014–2023
55Inventor score
Top patents by PatentIndex Score
12 records- 0186US12359910B2Device and method for measuring interfaces of an optical elementFOGALE NANOTECH·Filed 2021·Granted Jul 15, 2025·2 cites·20 claims
- 0280US11662199B2Method and device for measuring interfaces of an optical elementFOGALE NANOTECH·Filed 2020·Granted May 30, 2023·2 cites·15 claims
- 0360US2025285251A1Method for the full correction of an image, and associated systemFOGALE NANOTECH·Filed 2023·Application pending·0 cites
- 0460US2025285242A1Method for the full correction of the sharpness of an image, and associated systemFOGALE NANOTECH·Filed 2023·Application pending·0 cites
- 0547US2025271327A1Method and system for characterizing an optical lens for correcting optical aberrations introduced by said optical lens in an imageFOGALE NANOTECH·Filed 2023·Application pending·0 cites
- 0646US2024402040A1Method for the functional characterisation of optical lensesFOGALE NANOTECH·Filed 2022·Application pending·0 cites
- 0746US2024402039A1Method and device for measuring interfaces of an optical elementFOGALE NANOTECH·Filed 2022·Application pending·0 cites
- 0844US2025220312A1Method for correcting optical aberrations introduced by an optical lens in an image, apparatus and system implementing such a methodFOGALE NANOTECH·Filed 2023·Application pending·0 cites
- 0943US2025102397A1Method and device for determining geometric information relating to interfaces of an optical elementFOGALE NANOTECH·Filed 2023·Application pending·0 cites
- 1041US2024418600A1Method for the geometric characterisation of optical lensesFOGALE NANOTECH·Filed 2022·Application pending·0 cites
- 1137US2016202796A1Method for characterizing an object of interest by interacting with a measuring interface, and device implementing the methodFOGALE NANOTECH·Filed 2014·Application pending·0 cites
- 1235US10684233B2Positioning device for an integrated circuit board, and inspection apparatus for an integrated circuit board comprising such a positioning deviceUNITY SEMICONDUCTOR·Filed 2017·Granted Jun 16, 2020·0 cites·14 claims
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