Inventor · disambiguated record
Chau-Jern Cheng
Also filed as: CHENG CHAU-JERN
7 granted patents·15 citations·filing 2015–2019
77Inventor score
Top patents by PatentIndex Score
7 records- 0184US10983478B2Complex defect diffraction model and method for defect inspection of transparent substrateUNIV NAT TAIWAN NORMAL·Filed 2019·Granted Apr 20, 2021·6 cites·18 claims
- 0281US10613478B2Imaging method of structured illumination digital holographyUNIV NAT TAIWAN NORMAL·Filed 2017·Granted Apr 7, 2020·3 cites·8 claims
- 0380US10976152B2Method for defect inspection of transparent substrate by integrating interference and wavefront recording to reconstruct defect complex images informationUNIV NAT TAIWAN NORMAL·Filed 2017·Granted Apr 13, 2021·4 cites·8 claims
- 0474US10409048B2Method and apparatus for ultrafast time-resolved digital holographyUNIV NAT TAIWAN NORMAL·Filed 2017·Granted Sep 10, 2019·2 cites·20 claims
- 0546US10234268B2Method and apparatus for digital holographic microtomographyUNIV NAT TAIWAN NORMAL·Filed 2017·Granted Mar 19, 2019·0 cites·20 claims
- 0641US9958262B2System for measuring three-dimensional profile of transparent object or refractive index by fringe projectionNATIONAL SUN YAT SEN UNIVERSITY·Filed 2015·Granted May 1, 2018·0 cites·16 claims
- 0734US10042325B2Image processing methodUNIV NAT TAIWAN NORMAL·Filed 2015·Granted Aug 7, 2018·0 cites·5 claims
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