Inventor · disambiguated record
Jeffrey M. Scherer
Also filed as: SCHERER JEFFREY M · SCHERER JEFFREY MILTON
13 granted patents·1 pending application·78 citations·filing 2008–2016
88Inventor score
Top patents by PatentIndex Score
14 records- 0193US8593890B2Implementing supply and source write assist for SRAM arraysADAMS CHAD A·Filed 2012·Granted Nov 26, 2013·31 cites·20 claims
- 0290US9087607B2Implementing sense amplifier for sensing local write driver with bootstrap write assist for SRAM arraysIBM·Filed 2013·Granted Jul 21, 2015·15 cites·18 claims
- 0390US8331180B2Active bit line droop for read assistADAMS CHAD ALLEN·Filed 2010·Granted Dec 11, 2012·21 cites·7 claims
- 0462US9007857B2SRAM global precharge, discharge, and senseIBM·Filed 2012·Granted Apr 14, 2015·2 cites·10 claims
- 0559US8274848B2Level shifter for use with memory arraysADAMS CHAD A·Filed 2010·Granted Sep 25, 2012·2 cites·20 claims
- 0657US7751266B2High performance read bypass test for SRAM circuitsIBM·Filed 2008·Granted Jul 6, 2010·3 cites·18 claims
- 0752US7983080B2Non-body contacted sense amplifier with negligible history effectIBM·Filed 2009·Granted Jul 19, 2011·2 cites·19 claims
- 0851US7783943B2Method and apparatus for testing a random access memory deviceIBM·Filed 2008·Granted Aug 24, 2010·2 cites·1 claims
- 0943US9007858B2SRAM global precharge, discharge, and senseIBM·Filed 2013·Granted Apr 14, 2015·0 cites·4 claims
- 1042US8213249B2Implementing low power data predicting local evaluation for double pumped arraysADAMS CHAD ALLEN·Filed 2010·Granted Jul 3, 2012·0 cites·20 claims
- 1139US9715905B2Detecting maximum voltage between multiple power supplies for memory testingIBM·Filed 2015·Granted Jul 25, 2017·0 cites·20 claims
- 1239US8659937B2Implementing low power write disabled local evaluation for SRAMADAMS CHAD A·Filed 2012·Granted Feb 25, 2014·0 cites·20 claims
- 1336US2009285039A1Method and apparatus for locally generating a virtual ground for write assist on column selected sram cellsIBM·Filed 2008·Application pending·0 cites
- 1434US10311966B2On-chip diagnostic circuitry monitoring multiple cycles of signal samplesIBM·Filed 2016·Granted Jun 4, 2019·0 cites·20 claims
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