Inventor · disambiguated record
Patrick J. Mcginnis
Also filed as: MCGINNIS PATRICK J
2 granted patents·2 pending applications·29 citations·filing 2004–2008
60Inventor score
Technology areasG01R
Files withIBM4
Top patents by PatentIndex Score
4 records- 0173US7038474B2Laser-induced critical parameter analysis of CMOS devicesIBM·Filed 2004·Granted May 2, 2006·23 cites·20 claims
- 0249US7112983B2Apparatus and method for single die backside probing of semiconductor devicesIBM·Filed 2004·Granted Sep 26, 2006·6 cites·20 claims
- 0340US2008272474A1Apparatus for integrated circuit cooling during testing and image based analysisIBM·Filed 2008·Application pending·0 cites
- 0436US2007164426A1Apparatus and method for integrated circuit cooling during testing and image based analysisIBM·Filed 2006·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →