Inventor · disambiguated record
Eugene Atwood
Also filed as: ATWOOD EUGENE · ATWOOD EUGENE R · ATWOOD EUGENE ROGERS
20 granted patents·755 citations·filing 1996–2021
95Inventor score
Top patents by PatentIndex Score
20 records- 0196US9588177B1Optimizing generation of test configurations for built-in self-testingIBM·Filed 2016·Granted Mar 7, 2017·17 cites·20 claims
- 0295US5790384ABare die multiple dies for direct attachIBM·Filed 1997·Granted Aug 4, 1998·202 cites·28 claims
- 0394US6281573B1Thermal enhancement approach using solder compositions in the liquid stateIBM·Filed 1998·Granted Aug 28, 2001·160 cites·16 claims
- 0493US6656770B2Thermal enhancement approach using solder compositions in the liquid stateIBM·Filed 2001·Granted Dec 2, 2003·74 cites·22 claims
- 0589US12174251B2System testing using partitioned and controlled noiseIBM·Filed 2021·Granted Dec 24, 2024·2 cites·20 claims
- 0689US6212070B1Zero force heat sinkIBM·Filed 1998·Granted Apr 3, 2001·106 cites·40 claims
- 0787US5818984AOptoelectronic interconnection of integrated circuitsIBM·Filed 1996·Granted Oct 6, 1998·95 cites·16 claims
- 0883US6147506AWafer test fixture using a biasing bladder and methodologyIBM·Filed 1997·Granted Nov 14, 2000·53 cites·37 claims
- 0979US9209948B2Testing a decision feedback equalizer (‘DFE’)IBM·Filed 2015·Granted Dec 8, 2015·3 cites·13 claims
- 1076US9014254B2Testing a decision feedback equalizer (‘DFE’)IBM·Filed 2013·Granted Apr 21, 2015·3 cites·16 claims
- 1169US9335370B2On-chip test for integrated AC coupling capacitorsGlobalfoundries·Filed 2014·Granted May 10, 2016·2 cites·23 claims
- 1268US5805430AZero force heat sinkIBM·Filed 1996·Granted Sep 8, 1998·33 cites·5 claims
- 1361US12105834B2User privacy for autonomous vehiclesIBM·Filed 2020·Granted Oct 1, 2024·0 cites·3 claims
- 1461US11041879B2Fluidized alignment of a semiconductor die to a test probeIBM·Filed 2019·Granted Jun 22, 2021·0 cites·20 claims
- 1560US9041572B1Testing a digital-to-analog converterIBM·Filed 2013·Granted May 26, 2015·2 cites·18 claims
- 1658US11112457B2Dynamic weight selection process for logic built-in self testIBM·Filed 2019·Granted Sep 7, 2021·0 cites·18 claims
- 1754US11079433B2Logic built-in self test dynamic weight selection methodIBM·Filed 2019·Granted Aug 3, 2021·0 cites·18 claims
- 1854US7218128B2Method and apparatus for locating and testing a chipIBM·Filed 2005·Granted May 15, 2007·2 cites·23 claims
- 1949US11079406B2Semiconductor micro probe array having complianceIBM·Filed 2016·Granted Aug 3, 2021·0 cites·15 claims
- 2049US8405419B1Digital test system and method for value based dataATWOOD EUGENE ROGERS·Filed 2011·Granted Mar 26, 2013·1 cites·19 claims
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