Inventor · disambiguated record
Yasushi Niimura
Also filed as: NIIMURA YASUSHI
22 granted patents·2 pending applications·120 citations·filing 2001–2023
94Inventor score
Files withFUJI ELECTRIC CO LTD16FUJI ELEC DEVICE TECH CO LTD3FUJI ELECTRIC SYSTEMS CO LTD2NIIMURA YASUSHI2FUJI ELECTRIC HOLDINGS1
Top patents by PatentIndex Score
24 records- 0196US9881997B2Semiconductor device and manufacturing method of semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2016·Granted Jan 30, 2018·25 cites·10 claims
- 0292US9431290B2Semiconductor device and manufacturing method thereforFUJI ELECTRIC CO LTD·Filed 2015·Granted Aug 30, 2016·8 cites·28 claims
- 0391US9076725B2Semiconductor device and manufacturing method thereforFUJI ELECTRIC CO LTD·Filed 2014·Granted Jul 7, 2015·10 cites·20 claims
- 0487US9362393B2Vertical semiconductor device including element active portion and voltage withstanding structure portion, and method of manufacturing the vertical semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2015·Granted Jun 7, 2016·6 cites·27 claims
- 0583US7372111B2Semiconductor device with improved breakdown voltage and high current capacityFUJI ELEC DEVICE TECH CO LTD·Filed 2005·Granted May 13, 2008·11 cites·32 claims
- 0681US7911020B2Semiconductor device having breakdown voltage maintaining structure and its manufacturing methodFUJI ELECTRIC SYSTEMS CO LTD·Filed 2008·Granted Mar 22, 2011·9 cites·20 claims
- 0777US9653595B2Semiconductor device and semiconductor device fabrication methodFUJI ELECTRIC CO LTD·Filed 2014·Granted May 16, 2017·4 cites·7 claims
- 0874US9136352B2Manufacturing method of semiconductor apparatus and semiconductor apparatusNIIMURA YASUSHI·Filed 2010·Granted Sep 15, 2015·4 cites·19 claims
- 0969US6911692B2Semiconductor deviceFUJI ELEC DEVICE TECH CO LTD·Filed 2003·Granted Jun 28, 2005·13 cites·82 claims
- 1066US7859083B2Semiconductor deviceFUJI ELECTRIC SYSTEMS CO LTD·Filed 2008·Granted Dec 28, 2010·3 cites·13 claims
- 1165US7235841B2Semiconductor deviceFUJI ELEC DEVICE TECH CO LTD·Filed 2004·Granted Jun 26, 2007·11 cites·16 claims
- 1262US6894319B2Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2001·Granted May 17, 2005·9 cites·12 claims
- 1358US10553505B2Assessment method, and semiconductor device manufacturing methodFUJI ELECTRIC CO LTD·Filed 2019·Granted Feb 4, 2020·0 cites·15 claims
- 1456US6943410B2High power vertical semiconductor deviceFUJI ELECTRIC HOLDINGS·Filed 2002·Granted Sep 13, 2005·7 cites·54 claims
- 1556US2024186407A1Semiconductor device and method of manufacturing semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2023·Application pending·0 cites
- 1652US10211286B2Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2017·Granted Feb 19, 2019·0 cites·8 claims
- 1752US10008562B1Semiconductor device manufacturing methodFUJI ELECTRIC CO LTD·Filed 2018·Granted Jun 26, 2018·0 cites·10 claims
- 1852US9496370B2Manufacturing method of semiconductor apparatus and semiconductor apparatusFUJI ELECTRIC CO LTD·Filed 2016·Granted Nov 15, 2016·0 cites·1 claims
- 1952US9331194B2Semiconductor device and method for manufacturing semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2013·Granted May 3, 2016·0 cites·7 claims
- 2051US10381274B2Assessment method, and semiconductor device manufacturing methodFUJI ELECTRIC CO LTD·Filed 2016·Granted Aug 13, 2019·0 cites·16 claims
- 2150US9312379B2Manufacturing method of semiconductor apparatus and semiconductor apparatusFUJI ELECTRIC CO LTD·Filed 2015·Granted Apr 12, 2016·0 cites·8 claims
- 2248US9887260B2Semiconductor device and semiconductor device manufacturing methodFUJI ELECTRIC CO LTD·Filed 2016·Granted Feb 6, 2018·0 cites·8 claims
- 2347US9608057B2Semiconductor device and method for manufacturing semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2016·Granted Mar 28, 2017·0 cites·12 claims
- 2432US2012025262A1MOS Type Semiconductor Device and Method of Manufacturing SameNIIMURA YASUSHI·Filed 2011·Application pending·0 cites
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